新材料中微观形貌，元素成分，力学性质，电学性质检测方案(扫描探针)

智能文字提取功能测试中

HITACHIInspire the Next+49 2151 6435310 eminfo@hht-eu.com+81335047111customercenter.ev@hitachi-hightech.comwww.hitachi-hightech.com/global/science/www.hitachi-hightech.com/eu/Printed in Japan(H) HTD-E239 2016.10 SAEMic. A CompleteSolutionfor Correlative AFM-SEM AFM5500M·AFM5300E Hitachi's innovative solution for correlative AFM-SEM imaging， SAEMic.， enables easy navigationfor analysis of composition， topography， physical properties， and more，at the same sample location. SAEMic. A Complete Solution for Correlative AFM-SEMCorrelative AFM-SEM Using a Linkage Stage (SU8200+AFM5500M) DQuick navigation to the region of interest by SEM with an easy transfer to AFM DReal-time correlation of SE contrast， atomic step height， and surface potential by SEM/AFM/KFM*1 overlay *1 KFM： Surface potential SEM SEM and AFM overlav SEM and KFM overlay Correlative AFM-SEM Using an Air Protection Holder((SU8200+AFM5300E ●DCross-section and flat ion-milling instrument compatibility for easy sample preparation ●Decreased contamination in SSRM*2 and accurate EDX analysis due to oxidation protection *2 SSRM： Resistivity SEM and SSRM overlay EDX Analysis NiLa MnLa CoLa 25 pm SSRM Image (Resistivity Mapping) 1M 10M 100M 1G 10G Sample： Electrode for the LiB Correlative AFM-SEM for Magnetic Properties (SU5000 + AFM5300E) ●DMagnetic domains， spin properties， and composition identified by SEM+MFM techniques*3 *3 MFM： Magnetic Force MicroscopyMulti domain Single domain Spin@ Spin O Main phase：Nd2Fe14B AFM SEMFMSE 500 nm Grain boundary 凶 Sample： Hot processing Nd-Fe-B Magnet Sample courtesy： Daido Steel @Hitachi High-Technologies CorporationGlobal/Asia Europe Americas ( +1 800 253 3053 microscopy@hitachi-hta.comwww.hitachi-hightech.com/us )