第11楼2005/10/30
如此说来就不能用AFM看纳米线了!。
第12楼2006/06/07
The AFM developement is with 2 topics
(1) Miroscope : So fast scan, not drift for zoom in.out, offset change.. They are almost resolved by new developmet - Fast scan and close loop control. So in futur, AFM will look like SEM for topography operation.
(2) Material behaviour development : Electrical, Magnetic, Force, Thermal...These are unquire for SPM. SEM can not do these very well.
Honestly speaking. For Nano technology metrology platform, there are 2 basic platform. EM (SEM and TEM) amd SPM.
第20楼2007/05/22
赞成.
AFM的发展不过区区20年时间,利弊自然也都很清楚.每个厂家的AFM也是各有利弊.对于具体的使用,却取决于具体的需求.任何人购买一件东西都是要考虑多方面,要考虑性价比和实用性.除非是一些资金充裕的总是要买最好的.
举个例子,清华大学就购买过几台几十万美金一台的专门用来测量MFM的原子力显微镜(高分辨MFM).事实上每个对MFM感兴趣的用户都希望这样的设备,但是价格之高,其他应用之窄又是大多数人不能企望的.