大笨狗
第17楼2007/11/30
我这段时间搞别的东西了,好长时间没有碰激光共聚焦了。
你的激光共聚焦有粗糙度测量功能么?
向您请教一个问题:
在构建3D图中, “topography”选项下有一个“Generate”功能,是用来生成3D形貌的,有三种“Generate”方式,分别为maximum, center,First /Last。
说明书中有以下介绍:
Generate Topography
The three buttons provided in the Generate button bar allow you to generate the topography in different ways:
Maximum
• Click on the Maximum button to calculate the topography surface by finding the maximum intensity value. If the optical section with the highest intensity value is found, the intensity values of both
neighboring slices are also taken into account, so that a 3 point maximum fit is calculated.
• In case it happens, that the maximum possible intensity value is present in more than one optical slice for a given pixel (saturation), the mid section of all saturated intensity slices is chosen as a reasonable approach.
Center
• Click on the Center button to calculate the topography surface by using the center of gravity of all summed up intensities of the stack for a given xy print
*This mode provides better result for smooth surfaces of low intensity or nearly transparent surfaces. The receiver gain and offset has to be properly tuned and Mark First- MarkLast positions
of the stack should be located approximately in the same distance from the real surface.
First / Last
• Click on the First button to calculate the topography surface by using the first slice coming from the top, where the intensity reaches the value defined by the lower intensity threshold.
*This mode provides better result for surfaces of semitransparent materials with inclusions of higher reflectivity or transparent multilayers with subsurface layers of higher signal intensity.
以前计算粗糙度一直用Center来生成3D形貌,后来发现对于有些表面,用Maximum反而更合适。不知道你有没有这方面的经验?
我是砖家
第18楼2007/12/01
早就对共聚焦在立体材料测量方面的准确性提出疑义, 故一再希望大家能在此方面进行探讨,
原因之一, 为什么Leica早在20世纪就有材料共聚焦后又退出, Zeiss也迟迟未下手, 而二流的O记率先切入?
原因之二, 材料的特定问题是常规光学目前无法解决的, 大家跃跃欲试的吃蟹心态证明了这正是一崭新领域, 与其说应用不如说尝试, 而这一点被商业化忽视了
显微镜功用主要在观察, 材料方面的特殊点在于它纲量的准确传递. 即测量准确性. 所以用于测量的材料显微镜理应纳入计量名录. 而我的是否计量的询问又有谁自信地回复呢?
TOPO应该类似于逻辑方法, 有多种TOPO的存在, 可实际尺寸只有一个, 测量会有多个结果. 误差自然在, 只是多少问题, 是否在允许精度范围内. 不同测量方法决定采用何种TOPO方法比较合适.
个人认为, 定向照射光源才能提供较准确结果. 现高倍物镜下光的方向随物镜与样品之间距离的变化而变化, 并非最佳, 而三种topo方法最大能量法比较准确. 具体可能还要结合光路分析.
题外话, 谁对MEMS器件有认识, 不妨提出科普一下, 对它的线性, 迟滞, 寿命, 工作范围等?这种器件正被用在某个品牌的共聚焦的X轴方向上.
谁对Peizo器件有认识, 不妨提出科普一下, 对它的线性, 迟滞, 寿命, 工作范围等?这种器件正被用在多个品牌的共聚焦的多轴方向上.