Extreme Microscopy - at the Surface

  1. 类别:分析方法/应用文章
  2. 上传人:香港肯特科技
  3. 上传时间:2005/1/25 17:03:13
  4. 文件大小:433K
  5. 下载次数:262
  6. 消耗积分 : 免积分

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简介:

There is much discussion these days of Extreme Sports – sports that push the individual to the limits of his or her capabilities. The title of Extreme Microscopy might conjure up similar visions of intrepid and adventurous analysts, but this article is more concerned with situations that push the technique rather than the operator to the limits. “Extreme” in this context also refers to the information depth of the analysis technique. The properties of many modern materials, particularly those developed by the electronics and biomedical industries, depend on their surface chemistry. This will have been carefully engineered, utilising layers of nanometre thicknesses. These materials demand analysis methods that limit information to the extreme or outermost surface, and eliminate unwanted interference from the bulk or substrate. For current and future generations of such materials, only extreme microscopy will do.

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