您还有0次抽奖机会
锤子
Ellipsometry is a very sensitive measurement technique that uses polarized light to characterize thin films, surfaces,and material microstructure. Usually the polarization of light changes upon reflection. These changes are measured by an ellipsometer and interpreted on the basis of model calculations.
打开失败或需在电脑查看,请在电脑上的资料中心栏目,点击"我的下载"。建议使用手机自带浏览器。