Lateral and Chemical Force Microscopy:Mapping Surface Friction and Adhesion

Lateral Force Microscopy (LFM) is a scanning probe microscopy (SPM) technique that identifies and maps relative differences in surface frictional characteristics. Applied with contact mode atomic force microscopy (AFM), LFM is particularly useful for differentiating components of heterogeneous surfaces. Applications include identifying transitions between different components in polymer blends, composites and other mixtures; identifying organic and other contaminants on surfaces; delineating coverage by coatings and other surface layers; and using functionalized tips for chemical force microscopy.