锤子
消耗积分 : 免积分
TappingModeTM imaging has proved to be the most versatile mode of atomic force microscopy (AFM) in ambient conditions where the presence of a fl uid layer (condensed water vapor and other contaminants) severely limits the applicability of both contact mode and non-contact techniques. Overcoming the challenges posed by friction, adhesion, and other issues, TappingMode has provided a means of greatly extending AFM applications.
打开失败或需在电脑查看,请在电脑上的资料中心栏目,点击"我的下载"。建议使用手机自带浏览器。