NanoScope软件上的力谱数据分析

  1. 类别:相关软件
  2. 上传人:Bruker Nano Surfaces
  3. 上传时间:2008/6/18 11:45:10
  4. 文件大小:439K
  5. 下载次数:407
  6. 消耗积分 : 免积分

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简介:

The atomic force microscope (AFM) offers extraordinarily high resolution in force measurement applications, routinely yielding useful data down to the thermal noise floor of the cantilever, typically about 10pN. This along with the ease with which it is applied to many biological systems has made it a popular tool for studying such things as the specific interactions between biomolecules, the forces required to stretch polymeric molecules, and the forces that stabilize proteins. These sorts of applications have come to be collectively referred to as “force spectroscopy” applications.

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