原子力显微镜在隐形眼镜生产中的应用

  1. 类别:分析方法/应用文章
  2. 上传人:Bruker Nano Surfaces
  3. 上传时间:2008/6/23 17:52:52
  4. 文件大小:0K
  5. 下载次数:94
  6. 消耗积分 : 免积分

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简介:

Atomic Force Microscopy (AFM) has advanced biomaterials R&D by offering the unique ability to analyze surface properties non-destructively with nanometer-level resolution in ambient air or liquids. Polymer products used as biomaterials, including intra-occular implants and contact lenses, have represented one of the fastest growing sectors in the medical device industry. Significant increases in manufacturing output of contact lenses, especially in disposable products, are driving demand for better quality control and innovative new designs. Surface characterization is an integral part of contact lens R&D and quality control. Optical and electron microscopy, and stylus and optical profilometry are some of the conventional techniques used for characterizing the lenses and for developing and improving production processes. This application note describes some areas where the AFM provides new capabilities for surface characterizations that help speed product development efforts and, improve product quality, performance and yields.

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