使用配备 UHMI 的 Agilent 7900 ICP-MS 对矿物参比物质中的痕量金属进行分析

The analytical requirements of the geological survey and mining industries are demanding in terms of high number of samples, number of elements, time/cost constraints and the difficult matrices. Depending on the range of elements and concentrations, some samples are analyzed twice, with higher concentration elements measured by ICP-OES (ICP-optical emission spectroscopy), and trace elements measured using ICP-MS. For such samples, a single analysis would improve productivity and lower cost per sample. While ICP-MS is the only technique capable of measuring all of the required elements at trace levels, the wide range of analyte concentrations, high acid concentration and high total dissolved solids (TDS) of rock digests are challenging for the technique.