刻蚀在高分子薄膜上的全息光栅的拉曼成像

  1. 类别:分析方法/应用文章
  2. 上传人:HORIBA
  3. 上传时间:2016/9/28 12:57:27
  4. 文件大小:358K
  5. 下载次数:3
  6. 消耗积分 : 免积分

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简介:

Raman image (Figure 1) from a thin film of azobenzene-containing polymer thin film (300 nm) that is periodically structured (periodicity of ~1 µm). Raman measurements were recorded with a Labram HR 800 (HORIBA JobinYvon) spectrometer combined with an inverted microscope (Olympus IX 71) and a X,Y Piezoelectric stage to position the sample with the best accuracy and repeatability. A 100X, 0.9 NA microscope objective was used. A Raman spectrum (Fig. 2) was recorded every 100 nm along the X and Y directions with an integration time of 5 seconds per spectrum (λ excitation=752.4 nm). The variation of the Raman signal was integrated over the [10601180]cm-1 spectral domain (Figure 3). It must pointed out that details on the Raman profile are obtained with a spatial resolution better than λ/2 (at the diffraction limit).

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