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Atomic Force Microscopy (AFM) is one of the methods of scanning probe microscopy (SPM), which is a collective technique to measure local properties, e.g., height, friction, and magnetism. AFM consists of a sharp tip at the end of a cantilever as the probe, which is normally 3-6 μm tall pyramid and 15-40 nm end radius, to measure the force between the tip and the sample surface.
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