硫系玻璃的表征

2016/09/21   下载量： 4 次

方案摘要

方案下载
应用领域 材料
检测样本 玻璃
检测项目
参考标准 0

Characterization of various chalcogenide glasses was performed successfully using the UVISEL NIR Spectroscopic Phase Modulated Ellipsometer. The UVISEL NIR ellipsometer allows the determination of film thickness and optical properties with very high accuracy even where the film is many microns thick, and deposited on a transparent substrate. The versatility of the UVISEL NIR in terms of instrument resolution, sensitivity and step size and the power of the instrument software make the UVISEL NIR the most suitable instrument for determination of these sample structures.

方案下载
配置单
方案详情

Characterization of various chalcogenide glasses was performed successfully using the UVISEL NIR Spectroscopic Phase Modulated Ellipsometer. The UVISEL NIR ellipsometer allows the determination of film thickness and optical properties with very high accuracy even where the film is many microns thick, and deposited on a transparent substrate. The versatility of the UVISEL NIR in terms of instrument resolution, sensitivity and step size and the power of the instrument software make the UVISEL NIR the most suitable instrument for determination of these sample structures.


上一篇 颗粒分析+混合氧化石墨烯+分散状态的混合比例
下一篇 TiO2薄膜和多层减反膜的表征

文献贡献者

HORIBA（中国）
白金会员 丨 第22年
查看全部资料
相关仪器 更多
相关方案
更多

相关产品

当前位置： HORIBA 方案 硫系玻璃的表征

关注

拨打电话

留言咨询