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There is much discussion these days of Extreme Sports – sports that push the individual to the limits of his or her capabilities. The title of Extreme Microscopy might conjure up similar visions of intrepid and adventurous analysts, but this article is more concerned with situations that push the technique rather than the operator to the limits. “Extreme” in this context also refers to the information depth of the analysis technique. The properties of many modern materials, particularly those developed by the electronics and biomedical industries, depend on their surface chemistry. This will have been carefully engineered, utilising layers of nanometre thicknesses. These materials demand analysis methods that limit information to the extreme or outermost surface, and eliminate unwanted interference from the bulk or substrate. For current and future generations of such materials, only extreme microscopy will do.
用新型辉光放电质谱仪测定高纯金属——记忆效应研究
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