扫猫探针显微镜概述

2008/06/27   下载量： 205 次

方案摘要

方案下载
应用领域
检测样本
检测项目
参考标准

Scanning tunneling microscopy produced dramatic images of atomic lattices and atomic force microscopy broadened the technology to non-conductive surfaces. Development of atomic force microscopes has allowed scientists and engineers to see structure and detail with unprecedented resolution and without the need for rigorous sample preparation. Several advances have further extended this technique’s utility to a wide range of applications. Tapping Mode permits imaging of soft materials without damage to the sample and Lift Mode allows separate but simultaneous imaging of topography and other parameters, such as magnetic or electric forces, without cross-contamination. Phase Imaging has opened up the capability for mapping of surface compositional variations.

方案下载
配置单
上一篇 台阶仪在三维形貌表征领域的应用
下一篇 液态环境中的轻敲模式

文献贡献者

布鲁克纳米表面仪器部(Bruker Nano Surfaces)
白金会员 丨 第20年
查看全部资料
相关仪器 更多
相关方案
更多

相关产品

当前位置： Bruker Nano Surfaces 方案 扫猫探针显微镜概述

关注

拨打电话

留言咨询