spm-raman

2007-01-09 17:13  下载量:141

资料摘要

资料下载

Introduction: The spatial resolution of Raman systems employing normal optical microscopes is limited to approximately the wavelength of the light (about 0.5 µm), because both the illuminating laser light and the Raman scattered light are collected in the optical far-field (i.e many wavelengths of light away from the scattering material). This resolution is sufficient for many users, but some need the higher resolutions attainable by scanning probe microscopies (SPM) such as atomic force microscopy (AFM) and near-field scanning optical microscopy (NSOM). This need can now be fulfilled by the combined Nanonics NSOM/AFM-100 Confocal™/Renishaw RM Series Raman microscope. Previously, investigating a sample with both scanning probe microscopy and Raman microscopy required moving the sample from instrument to instrument. The exact region being analyzed by the Raman microscope could not generally be found again for imaging with the chosen scanning probe microscopic technique. Direct correlation of a SPM technique with Raman scattering was a dream…now it is a reality.

资料下载

文献贡献者

相关资料 更多

相关产品

当前位置: 四方仪器 资料 spm-raman

关注

拨打电话

留言咨询