null检测 | AFM+Raman -凯戈纳斯仪器商贸（上海）有限公司

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We present a method for combined far-field Raman imaging, topography analysis and near-field spectroscopy. Surfaceenhanced Raman spectra of Rhodamine 6G (R6G) deposited on silver nanoparticles were recorded using a bent fibre aperture-type near-field scanning optical microscope (NSOM) operated in illumination mode. Special measures were taken to enable optical normal-force detection for control of the tip–sample distance. Comparisons between far-field Raman images of R6G-covered Ag particle aggregates with topographic images recorded using atomic force microscopy (AFM) indicate saturation effects due to resonance excitation.

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