null检测 | nanonics技术突破-凯戈纳斯仪器商贸（上海）有限公司

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Nanonics presents a novel, patented planar, folded-piezo, flexure scanner design that allows simultaneous lateral and axial sample scanning as well as coarse inertial positioning. The ultra-thin package permits the scanner to be incorporated into systems where conventional scan stages would be too bulky. This unique device, developed for Nanonics' near-field scanning optical microscope, is now available as a stand alone addition for all scanning applications.

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