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In the present study, the polarization properties of propagation light within a polymeric optical waveguide were characterized by means of a polarized guide-collection-mode near-field scanning optical microscopy NSOM technique, and changes in the polarization properties around an indentation were evaluated. When transverse magnetic polarized light enters a waveguide, the light intensity becomes greater on the near side of the indentation than on the far side, as measured by a linearly polarized component perpendicular to the direction of light propagation. The most probable cause of this phenomenon is microdefects generated by the printing of the indentation. The polarized NSOM technique is useful in searching for small defects or stresses within integrated photonic devices.
PTT-显微拉曼-石墨烯检测
凯戈纳斯:Hot Disk瞬态平面热源法在建筑节能材料测试中的应用
凯戈纳斯:近场光学显微镜与传统光学显微镜的对比介绍
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