Dual Scanner Technology in an AFM

2007/12/10 下载量： 84 次

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应用领域
检测样本
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In roughly 20 years the atomic force microscopes moved from an esoteric invention to a routinely used tool for nanotechnology research and development. The AFM is credited with enabling many of the nanotechnology advancements in science and engineering. The AFM has applications in almost all science and engineering disciplines ranging from metrological measurements to visualizing nanostructures.

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