Crystal sensor for microscopy applications

2008/03/31   下载量: 32

方案摘要

方案下载
应用领域
检测样本
检测项目
参考标准

We report a force sensor based on a quartz crystal that is used for measuring nanoscale topographic images. The crystal is a length-extensional mode oscillator with a resonant frequency of about 650 kHz. Compared to 33 kHz tuning forks, such crystal sensors have a much higher resonance frequency, which allows for high force sensitivity and a fast response time. The crystal sensor is operated in the shear-force mode, with the probes vibrating parallel to the sample surface. The tip-sample interaction during operation is estimated to be less than 300 pN.

方案下载
上一篇 THINKY搅拌脱泡-ARV310
下一篇 Evaluation of Longitudinal Displacement for Lead Zirconate Titanate Films

文献贡献者

相关方案
更多

相关产品

当前位置: 实密国际贸易 方案 Crystal sensor for microscopy applications

关注

拨打电话

留言咨询