薄膜观察(thulium(III) 氧化物)

2009-06-01 14:15  下载量:74

资料摘要

资料下载

Thulium(III) oxide (Tm2O3) targets prepared by the polymer-assisted deposition (PAD) method were irradiated by heavy-ion beams to test the method’s feasibility for nuclear science applications. Targets were prepared on silicon nitride backings (thickness of 1000 nm, 344 mg/cm2) and were irradiated with an 40Ar beam at a laboratory frame energy of !210MeV (50 particle nA). The root mean squared (RMS) roughness prior to irradiation is 1.1nm for a !250nm (!220 mg/cm2) Tm2O3 target, and an RMS roughness of 2.0nm after irradiation was measured by atomic force microscopy (AFM). Scanning electron microscopy of the irradiated target reveals no significant differences in surface homogeneity when compared to imaging prior to irradiation. Target flaking was not observed from monitoring Rutherford scattered particles as a function of time.

资料下载

文献贡献者

相关资料 更多

相关产品

当前位置: 杭州葛兰帕 资料 薄膜观察(thulium(III) 氧化物)

关注

拨打电话

留言咨询