单波长椭圆偏振分析仪

第一部分中文介绍
English introduction to part II
仪器简介：

    我公司生产世界顶尖级椭偏仪，在国际同类产品中性价比最高。仪器具有高稳定性、长寿命、测量速度快、高准确性、高精度等一系列突出优点，是国内唯一大量出口销售美欧的椭偏产品。该仪器已在国内外著名企业得到长期成功应用。公司具有非常专业的工程师为您共同解决生产线应用技术问题， 是您最值得信赖和使用的椭偏产品。

    SC610型单波长椭圆偏振分析仪为可变入射角度、以He－Ne气体激光器波长632.8nm作为光源的椭偏仪。该仪器具有入射波长非常准确、很宽角度范围可选、样品准直简便易行等优点。单波长自动椭圆偏振分析仪适用于企业在线检测、控制、大专院校物理实验、实验室应用。

技术参数：

1．光 源： He-Ne激光器
2．波长范围： 632.8 nm
3．光斑直径： 1-2 mm
4．入射角范围：20度to 90度，5度/步
5．样品台尺寸：Ø160 mm
6．测试和数据分析软件
7．椭偏参数准确性：tg(Psi)≤0.01,cos( Delta)≤0.0001
8．集成化专用测量和分析软件

主要特点：

 非破坏性检测
 样品准直简单方便
 测量速度快
 可变入射角范围宽
 绝对测量
 软件分析功能强大
part II
English introduction

SC610 Discrete Wavelength Ellipsometer 
 Instrument Introduction:

We produce the world's top-class ellipsometers, which are the most cost-effective in the international similar products. Our instrument has outstanding advantages of high stability, long lifetime, high speed, high accuracy and high precision. The instrument has been famous enterprises at home and abroad, and long-term success of applications. The company has very professional engineers to solve the technical problems of production line applications. A large number of sales have been exported to the United States and Europe. Our ellipsometers are your most trusted products.
 
SC610 is a single wavelength ellipsometer with variable incident angle and a laser source. The instrument has accurate incident wavelength, wide range of incident angles, and easy sample alignment. SC610 is suitable for enterprise-line detection and control, physics experiments and laboratory applications.
 
Technical parameters:
1. Light source: He-Ne laser or solid state laser
2. Wavelength: 632.8 nm, 532 nm, 635 nm, 785 nm, 1064 nm, or 1310 nm, etc.
3. Spot diameter: 1-2 mm
4. Angle of incidence: 20 degrees to 90 degrees, 5 degrees / step
5. Size of the sample stage: Ø160 mm
6. Testing and data analysis software
7. Accuracy of ellipsometric parameters: tg (Psi) ≤ 0.01, cos (Delta) ≤ 0.0001
8. Integrated dedicated measurement and analysis software
 
Main features:
Non-Destructive Testing
l  Easy sample alignment
l  Fast measurement speed
l  Wide range of variable angle of incidence
l  Absolute measurement of optical constants
l  Powerful analysis software