Nanite update

2013-07-26 17:55  下载量:1

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NaniteAFM — Mountable AFM for Automated Applications The unparalleled small footprint of the NaniteAFM scan head and its highprecision/ quick mounting system make it the ideal atomic force microscope for integration into automated industrial environments. With a resolution below one nanometer, the NaniteAFM is capable of detecting and visualizing even the smallest surface structures. Simple handling and a multitude of integration possibilities bring your product analysis to a whole new level. Check coatings for intended structures or irregularities alike, or use additional measurement modes to detect features not visible in topography alone. Its ease of use and reproducibility make the NaniteAFM the perfect quality control tool for precision engineering, production process optimization, or semiconductor fabrication — just to name a few. 电化学工作站咨询电话 13167526845 北京亿诚恒达科技有限公司 selina@jhonors.com www.jhonors.com

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