Wiley表面分析到光谱分析软件的各种插件介绍
⇒ SEM Add-On
Provides support for scanning electron microscopy (SEM) images:
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• Group colorization of features
• Image corrections and enhancements
• Accurate height and surface roughness calculations
• Generate 3D rendering from images
• Associate EDX/EDS data to images
⇒ SPM Add-On
SPM enables support for scanning probe microscopy (STM, AFM, etc.) file formats and multi-channel data:
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• Advanced processing (line-by-line leveling, spatial filter, surface division, tip deconvolution, line correction, multiplane leveling)
• Math function operators
⇒ Particle Analysis Add-On
Particle Analysis provides a comprehensive toolset for analyzing particles, pores, grains, islands, etc., on structured surfaces:
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• Feature detection based on different segmentation principles
• Group particles based on shape, height, or size
• Calculate spherical caps
• Colorization
⇒ Profile Extension Add-On*
Adds support for profilometry, including:
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• Calculate roughness and surface texture
• Data corrections (outliers, defects and noise)
• Analyze surface geometry
A premium Wiley Surface-to-Spectral Analysis – Enhanced Edition package is also available.
It includes the features found in the basic package plus these add-ons:
• Particle Analysis and SPM add-ons (see details above)
• Chemical Cubes add-on:
Full visualization and analysis of multi-channel cubes for compositional data:
• Associate tomography and chemical analysis of materials in full 3D
• Access to a wide range of visualization and animation settings for the 3D cube
• Extract slices as color images
• Produce particle and grain statistics
Wiley智能拉曼光谱数据库
Wiley气相红外智能光谱数据库
Wiley表面分析到光谱分析---文件格式支持
Wiley新产品----表面分析到光谱分析软件
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