Wiley表面分析到光谱分析---插件介绍

John&Wiley约翰威立商务服务（北京）有限公司

Wiley表面分析到光谱分析软件的各种插件介绍

⇒ SEM Add-On

Provides support for scanning electron microscopy (SEM) images:

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• Group colorization of features

• Image corrections and enhancements

• Accurate height and surface roughness calculations

• Generate 3D rendering from images

• Associate EDX/EDS data to images

⇒ SPM Add-On

SPM enables support for scanning probe microscopy (STM, AFM, etc.) file formats and multi-channel data:

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• Advanced processing (line-by-line leveling, spatial filter, surface division, tip deconvolution, line correction, multiplane leveling)

• Math function operators

⇒ Particle Analysis Add-On

Particle Analysis provides a comprehensive toolset for analyzing particles, pores, grains, islands, etc., on structured surfaces:

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• Feature detection based on different segmentation principles

• Group particles based on shape, height, or size

• Calculate spherical caps

• Colorization

⇒ Profile Extension Add-On*

Adds support for profilometry, including:

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• Calculate roughness and surface texture

• Data corrections (outliers, defects and noise)

• Analyze surface geometry

A premium Wiley Surface-to-Spectral Analysis – Enhanced Edition package is also available.

It includes the features found in the basic package plus these add-ons:

• Particle Analysis and SPM add-ons (see details above)

• Chemical Cubes add-on:
Full visualization and analysis of multi-channel cubes for compositional data:

• Associate tomography and chemical analysis of materials in full 3D

• Access to a wide range of visualization and animation settings for the 3D cube

• Extract slices as color images

• Produce particle and grain statistics

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