资料摘要
资料下载INTRODUCTION Reflection of ligth from surfaces is part of our daily experience. However, an amazing property of optics is the possibility of having zero reflection. In more detail no reflection occurs from a clean and perfect interface illuminated under a unique angle of incidence with p-polarized light. This well-understood phenomenon is described by Brewster´s law providing the so called Brewster’s angle for the involved optical media. Any subsequent changes of the optical properties at the interface will lead to reflection. This fact is the basis of Brewster angle microscopy, a recent technique for the study of nanofilms at the water/air interface or at the surface of other transparent nonadsorbing dielectric substrates. Even just with a monolayer on an interface Brewster’s law is not fullfilled and the covered part of the surface reflects light although with very low intensity. By increasing the intensity of the illumination the contrast between the covered and the clean part of the surface can be enhanced. By using a microscope optic and a CCD-detector high contrast images of the lateral morphology of the layer can be taken. Typical fields of application are life sciences, colloid and surface chemistry and materials research.
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成像椭偏仪在石墨烯和MoS2领域的应用
简介：石墨烯的发现和应用前景极大地促进了二维材料的研究，MoS2作为另一种有着极大应用前景的二维材料，近年受到了广泛的关注。成像椭偏仪实现了传统椭偏仪对于亚纳米级薄膜分析优点和光学显微镜对于薄膜区域分析和形貌像分析的优点，近年来也受到了广泛光柱。成像椭偏仪是二维材料研究的有利工具。
消光型成像椭偏仪原理--Principles of Imaging Ellipsometry
简介：消光型成像椭偏仪原理 INTRODUCTION Ellipsometry is a very sensitive optical method, which has been used for about a hundred years to derive information about surfaces. It makes use of the fact that the polarization state of light may change when the light beam is reflected from a surface. If the surface is covered by a thin film (or a stack of films), the entire optical system of film & substrate influences the change in polarization. It is therefore possible to deduce information about the film properties, especially the film thickness. The name ”ellipsometry” implies that it has something to do with an ”ellipse”: The elliptical state of polarization, where the electrical field vector travels along an ellipse when observed at a fixed point in space, is the most general state of polarization. The basic components of an ellipsometer are: a light source, some optical components to modify the polarization and a detector. By using imaging technology, one can extend the classical ellipsometer to a new form of visualization tool or a microscope with extreme sensitivity to thin films.
德国欧库睿因（Accurion）成像椭圆偏振仪常见问题解答
简介：德国欧库睿因（Accurion）成像椭偏技术常见问题解答 1）成像椭圆偏振仪和传统椭圆偏振仪有什么区别 椭圆偏振是一项精确测量薄膜厚度，折射率等参数的技术，与传统椭圆偏振仪相比，成像椭圆偏振有以下特点： 成像可以让你看到样品 通过CCD相机你可以直接看到样品图片，这样的图片也可以展示椭偏对比度，让你分析样品的均匀性，对于非常薄的膜，只有椭圆偏振对比图可以成像，常规光学显微镜无法做到这一点。 精确定位的测量 你可以看到你的样品，所以你可以精确定位你想要测量的感兴趣点区域。即使样品需要成像，你也可以确保你在均一的地方测量。传统椭圆偏振仪给出的是一个平均数字。成像椭圆偏振给出的不是平均数字，而是实际数字。 更多的，你可以测量线装样品。我们的客户已经成功地在玻璃纤维和人的头发上做了测量。 高横向分辨率 Accurion成像椭圆偏振仪最高横向分辨率可以到1微米，其他传统椭圆偏振仪只有100-500微米，部分仪器可以达到50微米。 正是由于这个原因，我们的系统是测量表面结构，小面积薄膜，或者分析薄膜不均一性的理想仪器。 当然，成像椭圆偏振仪提供的纵向分辨率，根据不同的样品，可以高于1nm. 快速测量 使用Accurion的EP3-View软件，Ep3可以测量厚度分布度，当然包括折射率分布图，这种分布图包含整个可视范围。这种图片类似于原子力显微镜的图片。不需要扫描整个样品，整个过程在小于一分钟内完成。 使用成像椭圆偏振仪，你将有一种快速有效的技术在高分辨率测量微结构或者薄膜不均一性。因此，使用成像椭圆偏振仪EP3你能够确保得到你想要的相关数据。
成像椭偏仪在石墨烯领域应用
简介：同传统椭偏仪不同，成像椭偏仪在实现厚度测量时的亚纳米级的精度的同时，还能够获得被测试样的显微图像。这对单层/数层石墨烯的检测极为关键。文献利用Accurion的成像椭偏仪，对数层石墨烯进行了检测分析，并且利用拉曼光谱和原子力显微镜等检测技术的对比，证实了成像椭偏仪在石墨烯领域的应用潜力。
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