资料摘要
资料下载德国Theve 临界电流密度测试仪器 THEVR 已经发明了CryoscanTM这种技术, 用于更大薄膜样品的快速常规鉴定。这种仪器运 用一种感应技术，可以对高温超导晶片的临界电流密度进行无损绘图。它可以精确测量薄 膜质量，以及临界电流二维，高分辨率的分布图。也可以选择一个附件，使得这台仪器可 以对单一和双面薄膜转移温度进行测定。 CryoscanTM 操作过程极其简单，整个程序自动化控制。这台仪器用液氮作为冷却剂来运行， 可以应用于各种不同形状和大小的样品，并且几乎涵盖所有适合10“* 8” 扫描区域的晶片 和基板。 这种技术的空间分辨率可以调整至毫米范围。定制设计的晶片固定片可以与你的标准样品尺 寸相匹配。
文献贡献者
机器人在线检测成功应用案例
简介：DynaFlex 是汽车白车身在线检测系统：主要针对汽车白车身的孔，插槽，螺钉，螺母，边缘，轮廓，表面点，表面平整度等在线检测，系统可以在40秒内完成对整车的全检。检测每个点只需要3秒钟。另外：我们系统也可以检测汽车零部件，例如：车门、车架、引擎盖等。
开尔文探针扫描系统常见问题解答
简介：The Kelvin Probe method is a relative one. To determine the absolute work function of the sample the vibrating tip has to be calibrated against another “reference” surface. However the value of the tip work function is obviously only as good as the value taken for the reference surface. As a reference sample an aluminum metal plate covered with a thin gold layer has been used (fig. 2). Based on our experiments we assume the gold reference work function as 5.10 eV. The objective of this sample is to measure the contact potential difference (CPD) on the gold surface, and taking the gold reference as 5.10 eV to calculate the tip work function
开尔文探针扫描表面光电压谱用于太阳能电池的研究报告
简介：The scanned sample have been mounted on a aluminum sample holder (fig. 3). Before each SPV measurement the smples have been stored in dark for 12 hours. The contact potential difference (CPD) measured after the 12 hours has been taken as the zero level. The results presented in section 2 show an absolute surface potential change due to light illumination. All measurements have been made in ambient at a temperature of 20±2°C and relative hum idity of 41 ± 2%. In section 3 we presented the light source characteristics
开尔文探针表面光电压用于表面氧化和氮化硅涂层多晶的研究
简介：We have applied a high resolution scanning Kelvin probe to perform dark surface potential topographies of multicrystalline silicon solar cells having thin coatings of Si3N4 and SiO2. We clearly observe the electrical characteristics of the screen printed bus-bar and associated fingers, grain boundaries, together with characteristic structures on the oxide and nitride, coupled to significant surface potential variations across larger sections of the wafer. Associated surface photovoltage measurements can be unambiguously decoded to show coating and bulk contributions. The nitride coating exhibits carrier trapping lifetimes in excess of 13 minutes at 300K.
SPV 开尔文探针表面光电压研究
简介：A well‐aligned nanorods array of ZnO was chemically grown on conductive ITO substrate at low temperature. The photogenerated charges at surface and interface were examined by surface photovoltage techniques based on both Kelvin probe and lock‐in amplifier with dc bias. The photovoltage response bands related to band‐to‐band transition and bound excitons were discriminated. We demonstrated the spectrum‐dependent transfer characteristic of photogenerated charges at the surface of ZnO nanorods array and the interface between ZnO and ITO.
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