[EN英文]美国instec温控探针台（旧版）HCPS622

2015-08-19 11:24  下载量：1

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Instec’s HCPS622G Hot and Cold Probing Station offers an integrated solution for performing component-level electrical measurements over a wide temperature range. The HCPS622G provides the user with four independent electrical probes with X,Y,Z micro-positioning. As a single system the HCPS622G is the ideal solution for converting an existing inspection microscope or optical test setup into a precision temperature-controlled semiconductor testing and qualification station.

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上海恒商精密仪器有限公司
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