供货周期: | 一周 |
品牌: | |
规格: | resolution accurate to 0.05nm |
货号: | 628 |
CAS号: |
Colloidal cobalt provides an excellent substrate for AFM tip characterization and instrument operation. Image at top demonstrates height calibration at 1nm (red line profile) and 3nm (green line profile) on the standard.
Available on 5x5mm silicon wafer chips unmounted or mounted on 12mm stainless steel metal disk. Tip characterization down to angstrom resolution is easily attained. Image at top demonstrates 1 and 3nm height resolution accurate to 0.05nm.
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