Semyos

Semyos

  • 型号:Semyos
  • 产地:其他国家
  • 品牌:帕纳科/PANalytical
  • 性质:生产商
  • 报价:面议

核心参数

产品详情

仪器简介:

PANalytical's Semyos energy-dispersive XRF wafer analyzer is the latest of our successful process control tools designed specifically for semiconductor and data storage metrology. This versatile instrument determines layer composition and thickness uniformity for a wide range of process films.

Moreover, with its<23um FWHM microspot, it is able to measure in the scribelines or in dedicated metrology areas on production wafers.

The Semos wafer analyzer is an advanced metrology tool that addresses the following industry demands:
* On-product thin film metrology
* In-line process control
* Simultaneous determination of film thinkness and composition
* Ability to characterize single films and multi-layer stacks
* Excellent repeatability and reproducibility (Gauge R&R)
* Minimal COO through excellent uptime, high throughput and minimum consumption of utilities



主要特点:

Semyos: Addressing the needs of the semiconductor and data storage industry.

Microspot XRF analysis on production wafers
Versatile wafer handling
For in-line production XRF analysis
Designed for ease-of-use

Semyos信息由马尔文帕纳科为您提供,如您想了解更多关于Semyos报价、型号、参数等信息,欢迎来电或留言咨询。

注:对于医疗器械类产品,请先查证核实企业经营资质和医疗器械产品注册证情况

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