XRF(X射线荧光光谱分析)法测硫固体标准品
Monitor Samples for XRF-Silicate Glasses. Optically polished on the analytical surface; sizes 30-40mm in
diameter and 5mm in height.
用于XRF法检测标准,一般使用的固体标准品需要光学抛光,尺寸宽度在30-40mm,高度5mm。根据含硫量不同,一般分为高硫、低硫、中硫三种检测标准。
详细如下:
1、High level of Sulfur approx. 0.70wt% 货号:SGL-Hl
2、Low level of Sulfur approx. 0.005wt% 货号:SGL-LO
3、Mid level of Sulfur approx. 0.050wt% 货号:SGL-MD
详细请咨询技术支持:
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FAX:010-88482623