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非接触式轮廓仪/粗糙度仪
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Rtec-instruments new multi-functional profilometers are designed to give best performance with leading edge optics, advanced algorithms and engineering designs. Each of our profilometer has high end electronics, negligible drift, low floor noise and is extremely easy to use.
We offer several profilometer models that are suited for various applications. Nano to macro range can be scanned with ease using offered profilometer. Each profilometer can create high resolution 3d images, measure flatness, roughness, waviness, step height, defects, scratch , volume wear, features etc. The profilometer comes with our proprietary imaging software and/or can be used with several standard software such as SPIP or Mountain Surf.
Few of our standard profilometer models are mentioned below. Please contact us to learn more about our profilometer.
Next generation white light interferometer that uses advanced algorithms, latest generation hardware, high end electronics to set a class of its own.
Multi color LED for best quality picture
No thermal drift
Advanced algorithm for data processing
0.01nm resolution
Main Features:
Multi color high intensity LED
The unique, complex algorithm and latest generation hardware allows the tester to exploit the advantages of multi color led. Combination of blue and white LED gives the best XYZ resolution images and green color gives least florescence . Multi-color LED also allows to generate real color images of sample.
5 million pixel 3D image
Advanced camera, high speed controllers, fast data acquisition allows the tester to create images upto 5 million pixels
High quality objectives
We use high quality objectives from Nikon. Tester comes with 6 objective turret that can accommodate objectives from 2.5x to 100x.
Low noise
Anti vibration table, acoustic enclosure, negligible thermal drift, close loop controllers allows the tester to create high resolution images without any noise.
Working modes Tester has both Coarse (WLI) and fine mode (PSI) that allows it to achieve 0.01nm resolution in roughness measurement.
Specifications: Scanning range
Up to 150mm x 150mm (Optional 200m, 310mm)
Sample thickness 100mm
Tilt +/- 10degree
| Objective Magnification | 50x | 20x | 10x | 5x | 2.5x |
| Numerical Aperture | 0.55 | 0.40 | 0.30 | 0.13 | 0.075 |
| Field of View (µm) | 266 x 266 | 532 x 532 | 1064 x 1064 | 2128 x 2128 | 4256 x 4256 |
| Spatial Sampling with | 0.14 | 0.28 | 0.55 | 1.1 | 2.2 |
| Optical resolution @ | 0.50 | 0.69 | 0.92 | 2.12 | 3.67 |
| Working distance (mm) | 3.4 | 4.7 | 7.4 | 9.3 | 10.3 |
| Depth of focus @550nm | 1.16 | 2.19 | 3.89 | 20.72 | 62.25 |
| Degrees of maximum | 22.6 | 9.5 | 4.8 | 2.4 | 1.2 |
Industries
Automotive, cosmetic, aerospace, chemical, polymer, coatings, paint, semiconductor etc.
美国Rtec三维形貌仪测量系统沿着纵轴捕获一系列位置的光强数据。通过白光干涉图的形状，干涉图的局部相位或者是二者的结合来确定表面位置。本公司还有激光共焦，白光共焦，拉曼光谱仪等，可以把这些设备自由组合在一起，以实现客户的不同需求
特点：
快速直观的操作
较高的计算程序，精确的高测量速度和简便的操作软件，使用户能够快速的分析和创建报告
多个物镜
带有6物镜转轮，包括多个物镜：长焦，短焦，不同数值孔径，投射镜头等
电子器件
先进的控制器，低机械噪声，自校准系统，可选波长，64位并行处理器，标准分辨率达到1920*1920
硬件
能够被固定到全自动化的平台，高强度LED10年保修，高级精加工零部件，低能耗，远程访问，内置相机侧视图，有效照明等。
软件
三维虚拟软件
影像分析
多种标准，粗糙，平面，波浪以及其他表面参数
微粒（粒子）和细孔分析
力曲线分析
附带傅里叶分析
过滤
用户界面报告的创建和编辑
影像编辑特征-光，颜色等
尺寸，表面积，体积，承载比分析
纹理计算，分类，其他纹理分析
光谱和分形分析
先进的统计分析
能够输出原始数据，影像，全部报告
数个可用的附加功能
参数：
内校准
4百万像素
可选波长
高强度长寿命LED
1920*1920成像
64位中央处理器
低机械噪声
并行处理
6物镜转轮
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