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UpIR™ 上看型漫反射附件
The UpIR is designed as a tall structured accessory with the sampling surface above the plane of the spectrometer and is used by placing large, solid samples face down onto the top plate of the accessory. In the case of powdered or small solids, they can be placed into a suitable sampling cup at the top of the UpIR. This design is uniquely suitable for mid-IR analysis of coatings on metallic surfaces of large or small samples. For this application, analysis is rapid and easy because no sample preparation or cleanup is required.
Out-of-compartment design for analysis of large samples
Upward looking optics providing easy analysis of samples placed face down
Pre-aligned, fixed position optical components for reproducible, high quality data
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