牛津OXFORD Lab-X 配件 51-760_价格_北京谱朋科技有限公司

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产品特点：

CMI760 PCB Thru-hole and Surface Cu System

The CMI760 is a benchtop system offering complete solutions for the PCB industry. The instrument can measure the thickness of surface copper – including copper foil, laminated copper, traces and pads – as well as the thickness of plated thru-hole copper. Used at incoming inspection, at the production line, or in final QC, the CMI760 provides precise results utilizing advanced micro resistance and eddy current technologies. The standard surface copper probe features a user-replaceable tip to reduce costs and minimize downtime. The illuminated, clear tip casing allows for easy placement on narrow traces. The optional plated thru-hole probe features automatic temperature compensation so it can test prior to and after etching, and works on double-sided and multilayer boards, even through tin and tin/lead resist.

订购信息：

货号	产品描述
51-760	CMI760 PCB Thru-hole and Surface Cu System

牛津OXFORD Lab-X 配件 51-760信息由北京谱朋科技有限公司为您提供，如您想了解更多关于牛津OXFORD Lab-X 配件 51-760报价、型号、参数等信息，欢迎来电或留言咨询。除供应牛津OXFORD Lab-X 配件 51-760外，北京谱朋科技有限公司还可为您提供其他等产品，公司有专业的客户服务团队，是您值得信赖的合作伙伴。

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供货周期：	一周
品牌：	牛津仪器
货号：	4363558