IntroductionIn Transmission Electron Microscopy (TEM) there are two ‘go to’ techniques for elemental analysis: EnergyDispersive X-ray Spectroscopy, (EDS), and Electron Energy Loss Spectroscopy, (EELS).EDS is a mature technique that can be used for most specimens. The intensity of generated X-raysis proportional to the mass thickness of the sample. However, this can become a limitation for verythin specimens or those comprising light elements. On the other hand, EELS is more suitable for thinsamples where the thickness is less than the inelastic mean free path of electrons in the material. EELSdoes, however, give high signal to noise for light elements. Simultaneous acquisition of both signals is apowerful tool for materials analysis.
【含量测定】取本品20片,精密称定,研细,精密称取适量(约相当于曲安西龙16mg),置100ml量瓶中,加甲醇适量,超声处理10min使曲安西龙溶解,放冷,用甲醇稀释至刻度,摇匀,滤过,精密量取续滤液5ml,置50ml量瓶中,用甲醇稀释至刻度,摇匀,测定。色谱条件:检测波长:UV 238 nm流动相:乙腈-水(18:82)洗脱方式:等度进样量:20 ul