二硫化钛晶体(99.995%) TiS2(Tantalum Sulfide)
二硫化钛晶体 TiS2(Tantalum Sulfide) 晶体结构:六边形晶体尺寸:~10毫米电学性能:半金属,逆磁性晶体结构:六边形晶胞参数:a = b = 0.340 nm, c = 0.570 nm, α = β = 90°, γ = 120°晶体类型:合成晶体纯度:>99.995% X-ray diffraction on a TiS2 single crystal aligned along the (001) plane. XRD was performed at room temperature using a D8 Venture Bruker. The 4 XRD peaks correspond, from left to right, to (00l) with l = 1, 2, 3, 4Powder X-ray diffraction (XRD) of a single crystal TiS2. X-ray diffraction was performed at room temperature using a D8 Venture Bruker. Stoichiometric analysis of a single crystal TiS2 by Energy-dispersive X-ray spectroscopy (EDX).Raman spectrum of a single crystal TiS2. Measurement was performed with a 785 nm Raman system at room temperature.