IntroductionWhen preparing a TEM lamella in focused ion beam (FIB), curtaining is a common obstacle. Curtaining is aroughness on the lamella as a result of non-uniform thinning which critically affects the quality of analytical datacollected, in addition to the ability to image and thin the lamella. A common cause of curtaining is the presence ofdifferent materials with a range of milling rates. The solution we discuss here to reduce curtaining is to change theorientation in which a lamella is ion beam polished/thinned by using the rotation function of the OmniProbe 400nanomanipulator.
Multi-element LA-ICP-MS analysis of the clay fraction of archaeological pottery inprovenance studies: a methodological investigation. J. Anal. At. Spectrom., 2020,35,2686-2696多元素 LA-ICP-MS 分析考古陶器中粘土部分的来源研究:方法学研究