二硫化钨晶体 2H-WS2
二硫化钨晶体 2H-WS2(Tungsten Disulfide)晶体结构:六边形晶体尺寸:~10毫米电学性能:N型半导体晶体结构:六边形晶胞参数:a = b = 0.315 nm, c = 1.227 nm, α = β = 90, γ = 120°晶体类型:合成晶体纯度:>99.995%X-ray diffraction on a single crystal aligned along the (001) plane. XRD was performed at room temperature using a D8 Venture Bruker. The 5 XRD peaks correspond, from left to right, to (00l) with l = 2, 4, 6, 8, 10Stoichiometric analysis of a single crystal 2H-WS2 by Energy-dispersive X-ray spectroscopy (EDX).Raman spectrum of a single crystal 2H-WS2. Measurement was performed with a 785 nm Raman system at room temperature.Powder X-ray diffraction (XRD) of a single crystal 2H-WS2. X-ray diffraction was performed at room temperature using a D8 Venture Bruker.