微纳分析

工业级飞秒激光微纳加工系统配件专业为工业微加工研究和生产而研发的成熟的技术，可用于飞秒激光打孔,飞秒激光蚀刻,飞秒激光多光子聚合等微纳加工应用。飞秒激光微纳加工系统配件具有非常绝佳的可靠性和超高的加工速度，飞秒激光器由于激光脉冲超短，提供了常见激光无以伦比的激光功率密度，其加工效果远远超过纳秒和皮秒激光。光束所到之处能够瞬间将材料汽化，由于激光脉冲超短，激光能量无法在如此短的时间内扩散到周围材料中，所以对加工区域周围影响微乎其微,是一种冷加工技术,加工效果堪称一流。飞秒激光微纳加工系统配件采用高达10W的Yb:KGW(1030nm)飞秒激光器作为激光光源,重复频率在1--1000KHz范围内可调，结合一流的精密扫描振镜,提供超高的微加工速度。系统配备Arotech公司高分辨率的定位平台，并同步激光光束扫描振镜和脉冲选择器, 在空间，时间和能量上提供全方位高精度控制。从而提供超高难度的加工能力，并达到亚微米精度的分辨率和重复性。配备机械视图系统,使用高分辨率的相机监控加工过程。飞秒激光微纳加工系统配件使用了贴别为微加工而设计的飞秒激光器，它比市场上出售的商业飞秒激光器具有更多优势，具有更高的稳定性和可靠性，达到工业使用的标准，飞秒激光放大器具有更短的脉冲(振动器80fs， 放大器280fs)，飞秒激光器具有更高的平均功率（振荡器高达2W, 放大器为6W），而且激光重复频率可调，计算机监控并控制激光。飞秒激光微纳加工系统配件规格 激光放大器参数 波长 1030nm 平均功率 6W 重复频率 1-1000KHz可调 脉宽 280fs-10ps计算机控制 最大脉冲能量 1mJ 输出稳定性1% 光束质量M2 2 脉冲选择器 多种频率选择 SH, TH,FH可选 激光振荡器参数 功率 1W 脉宽 80fs 重复频率 76MHz飞秒激光微纳加工系统配件特色 超高加工速度：高达350000像素 飞秒微细加工模式下具有最小的热影响区 工作面积高达：150x150mm 使用高性能振镜控制精密激光光束 激光脉冲数可控（1-350KHz)飞 飞秒激光微纳加工系统涉及技术 飞秒激光钻孔，飞秒激光切割，飞秒激光打孔 飞秒激光烧蚀,飞秒激光蚀刻,飞秒激光雕刻 2.5D铣，自定义模型划线, 表面微纳结构价格 改变材料的折射率,飞秒激光材料改性 飞秒激光三维多光子聚合 光学微操作…… MEMS制造掩膜制造和修理微片修复 燃料电池材料制造LIBWE,医疗应用激 光诱导扩散微光学、光子晶体、衍射光学元件制造波导和微透镜的制备

VANNAS维纳斯高级剪刀，直头卓越的尖部，总长75mm，有3mm和5mm两种刀刃。锋利、精确，适合各种精细显微操作。货号产品名称规格72932-013 mm Cutting Edge, 直头each72933-015 mm Cutting Edge, 直头eachVANNAS维纳斯高级剪刀，弯头卓越的尖部，总长75mm，有3mm和5mm两种刀刃。锋利、精确，适合各种精细显微操作.货号产品名称规格72932-023 mm Cutting Edge, 弯头each72933-025 mm Cutting Edge, 弯头eachVANNAS维纳斯高级剪刀，前角型式 卓越的尖部，总长75mm，有3mm和5mm两种刀刃。锋利、精确，适合各种精细显微操作。货号产品名称规格72932-033 mm Cutting Edge,前角型each72933-035 mm Cutting Edge, 前角型eachVANNAS维纳斯高级剪刀，边角型式 卓越的尖部，总长75mm，有3mm和5mm两种刀刃。锋利、精确，适合各种精细显微操作。货号产品名称规格72932-043mm Cutting Edge, 边角型each72933-045mm Cutting Edge, 边角型each

众所周知，优质显微镜用品和耗材是微束分析领域样品制备和产生理想结果的必要条件。成功的样品制备是从样品中获取优质图像和可靠数据的关键步骤。由南京覃思科技有限公司(www.tansi.com.cn)代理的荷兰Micro to Nano（简称M2N）进口显微镜耗材及用品，遵循“创新、实用和优质”之理念，产品用于电子显微镜和扫描探针显微镜技术领域。M2N公司在电子显微镜、样品制备、成像技术和产品分销领域拥有50多年的行业经验，对客户的需求有着深刻的理解。我们的显微镜用品，特别是电子显微镜用品，能为客户提供当前任务所需的耗品耗材。 荷兰M2N持续从事基于显微镜新需求的耗品研发，是SEM、TEM、FIB、AFM、SPM、LM等微纳领域之贴心伙伴，提供优质和创新的样品桩、样品座、碳膜载网、校准标样、靶材、碳棒、碳绳、工具、配件、银导电胶、碳胶带、铜胶带、储存盒、清洁用品、真空密封、安全防护等各种耗材器具，琳琅满目，应有尽有，显微分析领域耗材之理想选择！

众所周知，优质显微镜用品和耗材是微束分析领域样品制备和产生理想结果的必要条件。成功的样品制备是从样品中获取优质图像和可靠数据的关键步骤。由南京覃思科技有限公司(www.tansi.com.cn)代理的荷兰Micro to Nano（简称M2N）进口显微镜耗材及用品，遵循“创新、实用和优质”之理念，产品用于电子显微镜和扫描探针显微镜技术领域。M2N公司在电子显微镜、样品制备、成像技术和产品分销领域拥有50多年的行业经验，对客户的需求有着深刻的理解。我们的显微镜用品，特别是电子显微镜用品，能为客户提供当前任务所需的耗品耗材。荷兰M2N持续从事基于显微镜新需求的耗品研发，是SEM、TEM、FIB、AFM、SPM、LM等微纳领域之贴心伙伴，提供优质和创新的样品桩、样品座、碳膜载网、校准标样、靶材、碳棒、碳绳、工具、配件、银导电胶、碳胶带、铜胶带、储存盒、清洁用品、真空密封、安全防护等各种耗材器具，琳琅满目，应有尽有，显微分析领域耗材之理想选择！导电胶规格和指标如下：Paint / CementEM-Tec C30EM-Tec C32EM-Tec C33EM-Tec C38 EM-Tec AG15EM-Tec AG42EM-Tec AG44EM-Tec AG46EM-Tec NI41Product #15-001130 15-00113115-00113215-00113315-00113815-002114 15-00211515-002141 15-00214215-002143 15-00214415-002145 15-00214615-004141Filler Typewt%Graphite 20%Graphite 10%Graphite10%Carbon15%Silver 58%Silver73%Silver61%Silver60% Nickel50%Typethin pastethin pastethin paint thin pastepaintthin pastethin pastepaintthin pasteResistance (dry)30 ohm/sq30 ohm/sq1200 ohm/sq50 ohm/sq0.015 ohm/sq0.01 ohm/sq0.01 ohm/sq0.01 ohm/sq0.7 ohm/sqBindergelgelpolymeracrylicthermoplastic resinacrylic acrylicurethaneacrylicSolventWaterWaterIsopropanolAcetone/ MEKMEKToluene /acetoneAcetoneWaterToluene/ acetoneDensity1.12g/cm31.08g/cm30.84g/cm3 0.85g/cm31.63g/cm32.05g/cm31.7g/cm31.5g/cm32.1g/cm3Touch dry5min5min1 min3min10min 5min3min5min5minFull cure time @ 22°C24hr24hr15min24hrs8hrs24hrs24hrs24hrs24hrsFull cure time @ 65°C45min45min 5min30min30min30min30min3hrs 30minMinimum temperature-20°C-20°C-20°C-40°C -20°C-40°C-40°C-40°C-40°CMaximum temperature+140°C+140°C+200°C+120°C+105°C+120°C+120°C+120°C+120°CMechanical strengthlowlowlowhighmediumhighlowlowhighVacuum compatible (dry)excellentexcellentyes yesyesyesyesyesyesRoHs compliantyesyesyesyesyes yesyesyesyesWeight40g/100g25g15g25g15g / 25g15g / 25g15g / 25g15g / 25g25gBottle size60cc/100cc30cc 30cc30cc15cc / 30cc15cc/15cc15cc/30cc15cc/30cc 30ccThinner-ExtenderWaterWaterIsopropanolAcetone MEKAcetoneAcetoneWaterAcetoneShelf life @ 20°C 3 year 3 year 3 year 3 year 3 year 3 year 3 year 3 year 3 year银导电胶 15-002114 EM-Tec AG15 silver paint, 15g bottle15-002115 EM-Tec AG15 silver paint, 25g bottle EM-Tec AG15 is a conductive silver paint based on very fine silver flakes with a thermoplastic resin binder with MEK / acetone as diluent. EM-Tec AG15 is fully comparable to EDAG 1415M and DAG 915 from Acheson / Henkel. Applications are making grounding paths and conductive glue for SEM samples, electronic and shielding applications. Achieves good bonding properties on a wide variety of materials including, plastics, ceramics, glass, metals, wood, rubber, epoxies and textiles. The low viscosity silver paint is ideal for making grounding tracks and to bond SEM samples on sample stubs. Samples can be easily removed. This silver cement has the consistency of a paint. Dries relatively quickly, depending on thickness reduce drying time with moderate heat up to 70°C. Solution contains 57.5 – 59 % silver. EM-Tec AG15 exhibits excellent conductivity. 15-002141 EM-Tec AG42 strong and highly conductive silver cement, 15g bottleEM-Tec AG42 is a strong conductive silver cement based on fine silver flakes (10-1μm) with an acrylic binder. Achieves excellent bonding properties on a wide variety of materials including, plastics, ceramics, glass, metals, wood, rubber, epoxies and textiles. The strong and tough acrylic binder reduces material loss where as the silver flakes ensure excellent conductivity. Use when highest conductivity is needed. Ideal for making grounding tracks and to bond SEM samples on sample stubs. This silver cement has the consistency of a paste. Dries relatively quickly, depending on thickness drying time can be reduced with moderate heat up to 65°C. Can be used on flexible surfaces. Solvent is acetone, solution contains approximately 73% silver, acrylic based binder. Excellent conductivity. Supplied in a 15cc glass bottle with a brush, 15 gram.15-002145 EM-Tec AG46 water-based conductive silver paint, no VOC, 15g bottleEM-Tec AG46 is a conductive silver paint based on fine silver flakes (10-1um size) with a water based urethane binder. It does not contain VOC, is solvent-free and is non-flammable. Achieves excellent bonding properties on a wide variety of materials including, plastics, ceramics, glass, metals, wood, paper and paints. Safe to use on even the most delicate plastics. The water-based urethane binder reduces material loss whereas the silver flakes ensure excellent conductivity. Ideal for making grounding tracks and to bond SEM samples on sample stubs. Samples can be easily removed. This silver cement has the consistency of a paint. Dries relatively quickly, depending on thickness reduce drying time with moderate heat up to 65°C. Solvent is water, solution contains 60% silver, urethane based binder. EM-Tec AG46 exhibits excellent conductivity. Supplied in a 15cc glass bottle with a brush, 15 gram. Keep container above 0 degrees Celcius do not freeze!银胶稀释液 15-002170 EM-Tec STC15 solvent / thinner / cleaner for EM-Tec AG15 silver paint, 30ml bottle EM-Tec STC 15 extender, thinner and cleaner for the EM-Tec AG15 conductive silver paint. 99.9% pure Methyl Ethyl Ketone (MEK). Supplied in a 30cc glass bottle.

【产品介绍】MetArray质谱芯片匹配ClinMS-Plat Ri质谱仪使用，是一款通用型代谢芯片，可快速高灵敏度地检测生物液体中的极性代谢分子和脂质分子。 【产品优势】限域性强，可容纳任何有机溶剂体系的溶液 | 尺寸精确可控，孔径、孔间距可个性化定制 | 免基质，质谱检测灵敏度和稳定性高 | 普适性高，代谢分子与脂质分子通用

微纳立方为您提供了各种应用场合的微流控芯片，及相关附件，如下：微流控 PDMS芯片微流控 玻璃芯片塑料芯片细胞培养芯片微纳立方为客户提供用途各异的细胞培养芯片，示例如下：MicronitCellixVena8 Fluoro+TM Biochips 微流体芯片； Vena8 Endothelial+TM Biochips 微流体芯片 ；VenaT4TM Biochips 微流体芯片 ； Vena8 Glass Coverslip Biochips 微流体芯片； VenaDeltaY1TM Biochips 微流体芯片 ； VenaDeltaY2TM Biochips 微流体芯片 ；电阻抗测试芯片 Electrical Impedance Spectroscopy 微流控芯片夹具类微流控芯片及附件毛细管，接头，插头等配件————————————————微流控产品：MFCS-EZ 微流体进样系统FRP流速监测系统恒流控制功能M-Swich通道切换解决方案微流控系统专用显微镜微流控分析系统… … 如上为微纳立方为微流控芯片系统提供的各种用途应用产品及附件，如有相关问题，欢迎关注微纳立方

纳谱分析微孔滤膜有多种材质、规格的滤膜可供选择。微孔滤膜能够从气相或者液相中截留微粒、细菌及其它杂质，以达到分离、净化、提纯的目的。主要用于色谱分析中流动相及样品的过滤,对保护色谱柱及输液泵管路和进样阀等不被污染具有良好的作用。0.45μm能滤除大多数细菌生物 常规样品、流动相过滤,能够满足一般色谱要求 0.22μm能去除样品、流动相中极细颗粒的要求,可以达到GMP或者药典规定的99.99%的要求。一般来说：对于使用3μm或者更大粒填料的色谱柱系统,可采用0.45μm的针式过滤器或滤膜；对于使用小于3μm填料的色谱系统,或涉及微生物生长的色谱系统,推荐使用0.22μm的滤膜。材质规格13mm×0.22μm13mm×0.45μm25mm×0.22μm25mm×0.45μmMCEM-2522MCEM-2545MCEM-5022MCEM-5045MCEPESM-2522PESM-2545PESM-5022PESM-5045PES尼龙M-2522NY M-2545NYM-5022NYM-5045NYPTFEM-2522PTM-2545PTM-5022PTM-5045PTPVDFM-2522PVM-2545PVM-5022PVM-5045PV

工业级飞秒激光微纳加工系统配件专业为工业微加工研究和生产而研发的成熟的技术，可用于飞秒激光打孔,飞秒激光蚀刻,飞秒激光多光子聚合等微纳加工应用。飞秒激光微纳加工系统配件具有非常绝佳的可靠性和超高的加工速度，飞秒激光器由于激光脉冲超短，提供了常见激光无以伦比的激光功率密度，其加工效果远远超过纳秒和皮秒激光。光束所到之处能够瞬间将材料汽化，由于激光脉冲超短，激光能量无法在如此短的时间内扩散到周围材料中，所以对加工区域周围影响微乎其微,是一种冷加工技术,加工效果堪称一流。飞秒激光微纳加工系统配件采用高达10W的Yb:KGW(1030nm)飞秒激光器作为激光光源,重复频率在1--1000KHz范围内可调，结合一流的精密扫描振镜,提供超高的微加工速度。系统配备Arotech公司高分辨率的定位平台，并同步激光光束扫描振镜和脉冲选择器, 在空间，时间和能量上提供全方位高精度控制。从而提供超高难度的加工能力，并达到亚微米精度的分辨率和重复性。配备机械视图系统,使用高分辨率的相机监控加工过程。飞秒激光微纳加工系统配件使用了贴别为微加工而设计的飞秒激光器，它比市场上出售的商业飞秒激光器具有更多优势，具有更高的稳定性和可靠性，达到工业使用的标准，飞秒激光放大器具有更短的脉冲(振动器80fs， 放大器280fs)，飞秒激光器具有更高的平均功率（振荡器高达2W, 放大器为6W），而且激光重复频率可调，计算机监控并控制激光。飞秒激光微纳加工系统配件规格 激光放大器参数 波长 1030nm 平均功率 6W 重复频率 1-1000KHz可调 脉宽 280fs-10ps计算机控制 最大脉冲能量 1mJ 输出稳定性1% 光束质量M2 2 脉冲选择器 多种频率选择 SH, TH,FH可选 激光振荡器参数 功率 1W 脉宽 80fs 重复频率 76MHz飞秒激光微纳加工系统配件特色 超高加工速度：高达350000像素 飞秒微细加工模式下具有最小的热影响区 工作面积高达：150x150mm 使用高性能振镜控制精密激光光束 激光脉冲数可控（1-350KHz)飞 飞秒激光微纳加工系统涉及技术 飞秒激光钻孔，飞秒激光切割，飞秒激光打孔 飞秒激光烧蚀,飞秒激光蚀刻,飞秒激光雕刻 2.5D铣，自定义模型划线, 表面微纳结构价格 改变材料的折射率,飞秒激光材料改性 飞秒激光三维多光子聚合 光学微操作…… MEMS制造掩膜制造和修理微片修复 燃料电池材料制造LIBWE,医疗应用激 光诱导扩散微光学、光子晶体、衍射光学元件制造波导和微透镜的制备

众所周知，优质显微镜用品和耗材是微束分析领域样品制备和产生理想结果的必要条件。成功的样品制备是从样品中获取优质图像和可靠数据的关键步骤。荷兰Micro to Nano（简称M2N）进口显微镜耗材及用品，遵循“创新、实用和优质”之理念，产品用于电子显微镜和扫描探针显微镜技术领域。M2N公司在电子显微镜、样品制备、成像技术和产品分销领域拥有50多年的行业经验，对客户的需求有着深刻的理解。我们的显微镜用品，特别是电子显微镜用品，能为客户提供当前任务所需的耗品耗材。覃思科技 (www.tansi.com.cn)是荷兰Micro to Nano（简称M2N）进口显微镜耗材及用品的代理商。提供优质和创新的样品座、碳膜载网、校准标样、靶材、碳棒、碳绳、工具、银导电胶、碳胶带、铜胶带、储存盒、真空密封等各种耗材器具，欢迎新老客户咨询下单！双面铜导电胶带 EM-Tec double sided conductive copper tape for SEM / FIB applications.The EM-Tec double sided conductive copper tape has a layer of conductive acrylic adhesive on both sides. Highly electrically conductive with a resistance through the adhesive 1 Ohm. This double sided conductive copper tape has the same specifications as the 3M 1182 tape. Ideal for mounting samples directly on sample stubs whilst establishing a grounding path. Either to mount large samples on stubs or for smaller samples directly on the tape. Non-conductive samples surfaces should be coated to obtain best imaging results. Can be used for long term applications. Much better conductivity than carbon tape and carbon tabs. The soft copper tape can be easily cut to the required size. Available with 6, 12, 20, 25 and 50mm width and length of 33m. Both side are covered with siliconised backing paper which makes it easy to unwind the tape and cut to size before applying the tape. Remove the siliconised paper from one side first apply copper tape and then remove the other backing paper. Tip: Try to minimise the exposed area of tape in the SEM to reduce outgassingSpecifications:Tape material Copper, 99.98% purityAdhesive Conductive acrylic adhesive (2x)Copper tape thickness0.035mmAdhesive thickness 0.025 +/- 0.005 mm + 0.022 +/- 0.005 mmTotal tape thickness0.082 +/- 0.01mmBacking paper thickness0.14mm (2x)Resistance 1 OhmAdhesive strength 10N / 25mm per sideTape strength 45N / mm2Use temperature range -10 to +120 °CLengthWidth33mChoice of 6, 12 and 20mmCore diameter 76mm (3”) 高纯导电双面胶碳片 High purity conductive double sided adhesive carbon tabsThe EM-Tec high purity conductive double sided adhesive carbon tabs are supplied on a clear plastic sheet with a white plastic liner tab. Available as Ø6mm, Ø9mm Ø12mm and Ø25mm carbon tabs.To use: lift the tab of the clear backing sheet, press the sticky surface to the mount, then peel away the white liner tab, leaving the adhesive exposed. Mount sample on the exposed adhesive. Alternatively, the white liner tab can be removed, the stub pressed on the exposed carbon tab and the clear plastic lifted off. The use of sharp pointed tweezers helps to lift of the tabs and liner. The carbon tabs can be easily removed with isopropanol, ethyl acetate, ethanol or acetone. The Ø6mm carbon tabs are intended for smaller samples or when smaller tabs are requiredThe Ø9mm carbon tabs are compatible with Ø9.5mm JEOL stubsThe Ø12mm carbon tabs are compatible with Ø12.7mm pin stubs, Ø12.2mm JEOL stubs and Ø15mm Hitachi stubs.The Ø25mm carbon tabs are compatible with Ø25.4mm pin stubs, Ø25mm JEOL stubs and Ø25mm Hitachi stubs.高纯导电双面胶碳带High purity conductive double sided adhesive carbon tapesHigh purity conductive double sided adhesive carbon tapes: The material is identical to the material used for the tabs with one difference the tapes are self-wound with a thin white liner on one side of the tape. The tape can be shaped into custom forms, strips andcut-outs. Available in 5mm, 8mm, 12mm, 20mm and 50mm width by 20m long. To use: Cut the required length of carbon tape from the roll and cut to shape if needed (care since one side has exposed adhesive). Adhere tape to the sample support. Remove the top liner and adhere sample to the tape. The use of sharp pointed tweezers helps to lift the liner of the adhesive. The carbon tape can be removed with isopropanol, ethyl acetate, ethanol or acetone.

众所周知，优质显微镜用品和耗材是微束分析领域样品制备和产生理想结果的必要条件。成功的样品制备是从样品中获取优质图像和可靠数据的关键步骤。荷兰Micro to Nano（简称M2N）进口显微镜耗材及用品，遵循“创新、实用和优质”之理念，产品用于电子显微镜和扫描探针显微镜技术领域。M2N公司在电子显微镜、样品制备、成像技术和产品分销领域拥有50多年的行业经验，对客户的需求有着深刻的理解。我们的显微镜用品，特别是电子显微镜用品，能为客户提供当前任务所需的耗品耗材。覃思科技 (www.tansi.com.cn)是荷兰Micro to Nano（简称M2N）进口显微镜耗材及用品的代理商。提供优质和创新的样品座、碳膜载网、校准标样、靶材、碳棒、碳绳、工具、银导电胶、碳胶带、铜胶带、储存盒、真空密封等各种耗材器具，欢迎新老客户咨询下单！铜提升格栅铜制EM-Tec光纤提升格栅可提供2、3、4或5个立柱。厚度为30-40μm，这使得它们比标准TEM网格更加坚硬。EM-Tec-FIB提升栅经过独特的清洗过程以减少污染；这导致TEM片层的安装和成像得到改善。由于制造工艺的原因，铜丝提拉网格在正面边缘有一个背脊，并且侧壁光滑。包装尺寸为瓶/100。 2 post FIB lift-out grid 3 post FIB lift-out grid 4 post FIB lift-out grid 5 post FIB lift-out grid post size 250x200μm post sizes 125x200 & 80x200μm post size 80x200μm post size 60x190μm attach single lamellas attach multiple TEM lamellas attach many TEM lamellas attach many TEM lamellas 钼EM-Tec纤维提升格栅Mo-EM-Tec-FIB提拉栅比铜栅更坚固，也可用于铜干扰TEM片层研究的场合。标准Mo-FIB提升式格栅的厚度为45-55μm。可提供2、3和4根立柱。由于材料和制造工艺的原因，Mo-FIB提拉网格的侧壁比Cu-FIB提拉网格的侧壁粗糙。因此，需要使用FIB使侧壁更光滑。包装尺寸为小瓶/25。 2 post FIB lift-out grid 3 post FIB lift-out grid 4 post FIB lift-out grid post size 250x200μm post sizes 125x200& 80x200μum post size 80x200μm attach single lamellas per post attach multiple TEM lamellasattach many TEM lamellas

样品储存容器The EM-Tec EM-Storr vacuum sample storage container have been specifically developed by us, to store and protect SEM / FIB / TEM samples and calibration standards under vacuum. It protects valuable samples from air, moisture and dust. The superior EM-Storr vacuum container is constructed using high vacuum compatible materials: vacuum grade aluminim, a hardened safety glass lid, NBR O-ring and an all metal high vacuum valve with PTFE shaft seal. The outside of the aluminium container is hard anodised for protection. To reduce outgassing and to hold vacuum for extended periods, the inside surface is machined vacuum grade aluminium with a glass lid. The EM-Storr vacuum desiccator is capable of reaching vacuum in the 10-4 mbar range. The vacuum connection for pump-down is a 6mm (1/4”) barbed hose fitting – compatible with 6mm thick wall silicon vacuum hose. The EM-Storr vacuum containers are stackable the octagonal design is optimised for handling, strength and weight. StyleProduct #SamplesChamber size/ Overall sizeCapacityEM-Storr 81P13-001050-PPin stubs?80 x 15mm 120x120x45mm19 x ?12.7mm or 7 x ?25.4mm or 2 x ?32mm or 1 x ?38/?50/?63mm pin stubEM-Storr 81H13-001050-HHitachi M4 stubs?80 x 15mm 120x120x45mm19 x ?15mm or 7 x ?25mm or 2 x ?32mm or 1 x ?50/?63mm cylinder stubEM-Storr 81T13-001050-TTEM grids?80 x 15mm 120x120x45mm2 x 30 TEM grids in the EM-Tec #28-001030 GB-30 TEM storage boxEM-Storr 81F13-001050-F FIB lift-out grids?80 x 15mm 120x120x45mm1 x 100 FIB lift-out grids in the EM-Tec #28-002100 FSB100S FIB grid storage boxEM-Storr 83EL 13-001052-ELBulk / large samples?80 x 52mm 120x120x71mmLarge samples, maximum size ?80 x 52mm or 14 x 25 TEM grids or 4 x 100 FIB grids The EM-Tec Save-Storr sample storage containers have been developed to store sensitive samples under a dry and inert gas atmosphere. The EM-Tec Save-Storr sample storage containers consist of a clear polycarbonate hinged container with a seal, separate gas inlet and outlet valves and an over-pressure safety valve. The containers can be purged and filled with dry inert gas such as Nitrogen or Argon to protect moisture and oxygen sensitive samples. The construction allows vacuum pumping of the EM-Tec Save-Storr container first, before purging/filling it with inert gas. Using inert gas to protect samples is preferred for long term safe sample storage. The gas diffusion rate is lower than with vacuum storage containers due to the similar pressures in and outside the container. The EM-Tec Save Storr sample containers are available in four versions:Specification of the EM-Tec Save-Storr sample storage container:ParametersEM-Tec Save-Storr 2EM-Tec Save-Storr 4EM-Tec Save-Storr 7EM-Tec Save-Storr 10Product number#13-001060#13-001070#13-001075#13-001080Outside dimensions LxBxH 212 x 118 x 101mm238 x 184 x 103mm325 x 263 x 117mm325 x 263 x 169mmInside dimensions LxBxH200 x 99 x 89mm238 x 184 x 103mm303 x 229 x 103mm303 x 229 x 151mmVolume1.75 ltr4.4 ltr7.1 ltr 10.5 ltrGas inlet / outlet valvesMini ball valvesMini ball valvesMini ball valvesMini ball valvesGas inlet / outlet connectors6mm (1/4”) hose barb6mm (1/4”) hose barb6mm (1/4”) hose barb6mm (1/4”) hose barbMaterialPolycarbonateThick-walled ABSThick-walled ABSThick-walled ABSColourClearBlack BlackBlackCompatible gassesN2, Ar, CO2N2, Ar, CO2N2, Ar, CO2N2, Ar, CO2Maximum pressure1.5 bar / 0.15Mpa / 150kPa1.5 bar / 0.15Mpa / 150kPa1.5 bar / 0.15Mpa / 150kPa1.5 bar / 0.15Mpa / 150kPa

各种样品台（夹） 12-000110 EM-Tec GS10 swivel head sample holder for up to 10mm, gold plated brass, pin EM-Tec GS10 – A swivel vise which covers a full 180 angle and can also be rotated with the stub. This is the ultimate holder for imaging cross sections at any desired angle. The swivel head size without clamping screws is only 16x16x14mm. The sample is clamped with the two clamping screws the swivel head can be locked in place with the tilt clamping screw. Made from brass and plated with 1μm of pure gold. 12-000200 EM-Tec V22 compact vise type sample holder for up to 22mm, pin EM-Tec V22 compact vise sample holder for sample sizes up from 0-22mm with a pin. One fixed jaw and a spindle driven moving jaw. Jaw height is 10mm, clamping width is 25mm. Cost-effective compact vise which can be used in both standard SEMs and table top SEMs. Made from vacuum grade aluminium, brass spindle and stainless steel screws.12-000300 EM-Tec V22 compact vise type sample holder for up to 22mm, M4 EM-Tec V22 compact vise sample holder for sample sizes up from 0-22mm with M4 thread. One fixed jaw and a spindle driven moving jaw. Jaw height is 10mm, clamping width is 25mm. Cost-effective compact vise which can be used in both standard SEMs and table top SEMs. Made from vacuum grade aluminium, brass spindle and stainless steel screws. More info12-000320 EM-Tec VS42 universal spring-loaded large vise holder for up to 42mm, M4 EM-Tec VS43 universal double sided spring-loaded larger vise for samples with a maximum vise opening of 42mm. Different type of jaws can be mounted on the EM-Tec universal spring-loaded vise. Opens by pulling the jaws. Dowel pin pins be inserted in the brass slider to extend the opening size and to hold awkwardly shaped samples. With the dowel pins a disc of up 50mm diameter can be held 4 dowel pins are included. Includes triple grooved/smooth reversible vise jaws. Additional optionally available vise jaws are: Vise jaw with a single 120° large groove for round samples Standard reversible vise jaws with triple grooved/smooth side vise jaws can be stacked to increase the jaw heigth from 12 to 24mm. Made from vacuum grade aluminium, brass sliders and stainless steel rods and springs. The EM-Tec stub based SEM sample holders are all small SEM sample holders based on (modified) SEM sample stubs. They have the same footprint as the original SEM sample stubs and are directly compatible with the SEM stage or SEM sample stub holder. These affordable sample holders increase efficiency and reduce sample preparation time. Using sample holders reduces the use of conductive adhesives which can be a source of contamination. The EM-Tec stub based small sample holders formats are:Standard pin stub based compact sample holdersJEOL cylinder stub based sample holdersHitachi M4 stub based sample holdersThe pin stub based sample holders comprise the largest selection they can be easily used on other SEM platforms by using the cost efficient EM-Tec SEM stub adapters. All EM-Tec compact SEM stub based SEM sample holders are precision machined from vacuum grade aluminium unless otherwise noted. Provided with set screws and allen keys. Product #TypeMount sizesDimensions w/o pinMount holdingSEM stage comp.12-000226EM-Tec M26?25mm / ?1”?34x12.5mmSet screwStandard 3.2mm pin12-000326EM-Tec M26?25mm / ?1”?34x12.5mmSet screwM4 thread12-000626EM-Tec M26?25mm / ?1”?34x12.5mmSet screw?14mm JEOL stub12-000232EM-Tec M32?30mm / ?32mm / ?1-1/4”?40x12.5mmSet screwStandard 3.2mm pin12-000332EM-Tec M32?30mm / ?32mm / ?1-1/4”?40x12.5mmSet screwM4 thread12-000632EM-Tec M32?30mm / ?32mm / ?1-1/4”?40x12.5mmSet screw ?14mm JEOL stub12-000240EM-Tec M40?40mm / ?1-1/2”?48x12.5mmSet screwStandard 3.2mm pin12-000340EM-Tec M40?40mm / ?1-1/2”?48x12.5mmSet screwM4 thread12-000640EM-Tec M40 ?40mm / ?1-1/2”?48x12.5mmSet screw?14mm JEOL stub12-000251 EM-Tec M51?50mm / ?2”?59x12.5mmSet screwStandard 3.2mm pin12-000351EM-Tec M51?50mm / ?2”?59x12.5mmSet screwM4 thread12-000651EM-Tec M51?50mm / ?2”?59x12.5mmSet screw?14mm JEOL stub 我司还有各种各样的样品台，欢迎来电咨询。

上海屹持光电技术有限公司专业提供各种微纳结构加工服务典型案例： FIB加工微纳结构 紫外光刻微纳结构单晶硅反应离子刻蚀图片 ICP 刻蚀微纳结构 纳米压印点线图微流控细胞打印 EBL 刻写微纳阵列 FIB 用于器件电极沉积 激光直写图案激光直写器件微纳结构加工主要设备1，电子束曝光系统；2，聚焦离子束/ 扫描电子显微镜双束系统；3，双面对准接触式紫外光刻机；4， 单面对准紫外光刻机；5，金属高密度等离子体刻蚀机；6，硅刻蚀高密度等离子体刻蚀机；7，反应等离子体刻蚀机；8，纳米压印机。

样品台We offer a comprehensive choice of standard pin stubs to support virtually all applications. The standard SEM pin stubs are compatible with Thermo Fisher, FEI, Philips, Tescan, Phenom, Aspex, RJLee, AmRay, Cambridge Instruments, Leica, CamScan, Aspex, ETEC and Novascan SEMs. They are made from vacuum grade aluminium. They are machined according to the original manufacturer' s specifications and dimensions. The flat pin stubs from 12.7mm to 38mm diameter are grooved for easy and clean handling. The most used pin stubs are the ?12.7 mm and the ?25.4 mm pin stubs. Pins are all 3.2mm diameter with a length of either 8mm or 9.5mm. The ?12.7 mm pin stubs are also available in brass, copper and high purity carbon. The full range of standard SEM pin stubs and mounts include:Flat SEM pin stubs6.4, 9.5, 12.7, 19, 25.4, 32, 38, 50, 63 and 100mm stub diameterSpecial 12.7mm stub diameter with a flate side and 12.7mm stub in brass and copper.Angled pin stubs to quickly image or analyse a sample under 30°, 45°, 70° or 90° w/o tilting the sample stage:12.7mm stub diameter with 30°, 45°, 45/90° and 70° pre-tilt in various heights25mm diameter with 45°, 45/90°, double 45/90° and double 90°32mm diameter with 45°and double 90°Flat Pin stubs with extra height. Useful for marking, shorter working distance or to make your own custom stubs. Available as:12.7mm diameter with 4mm and 6mm extra height and 25.4mm diameter with 4mm extra heightLow profile 12.7 and 25mm pin stubs to enable very short working distances for high resolution SEM imaging and FIB operations. Horizontal (flat), 90° pre-tilt, 38° pre-tilt (for FEI systems) and 35° pre-tilt (Tescan systems)Engraved pin stubs with lines and numbers for mounting multiple samples or for relocating a sample. Stub diameters are 12.7, 19, 25.4 and 32mm.Swivel pin mount with a top diameter of 15mm which can be tilted 90o both ways.Dish cylinder stub with 12.7mm stub diameter for sample preparation of solutions or fluids directly on the stub. The dish design prevent fluid from dripping of the stub. Sample can be dried on the SEM stub.Cambridge S4 stub, which is not a pin stub but used on many SEMs with pin stubs. A Cambridge S4 holder or Cambridge S4 adapter is needed for the Cambridge S4 stub.SEM pin stub extenders to quickly adjust height and bring samples closer to the polepiece. If you need an SEM sample pin stub which is not offered in the list below, please contact us. We can manufacture custom sample stubs or suggest a solution with other sample stubs.

碳支持膜The C- range continuous Carbon only support films provide a thin electron transparent support without hydrocarbons present. A good solution for imaging nano-particles and viruses. Carbon film thickness is in the range of 15-20nm providing a thin consistent carbon film. The carbon TEM support films are electrically and thermally conductive under the electron beam at room temperature and provide image and specimen stability for high resolution imaging.The carbon TEM support films are available on 200, 300 and 400 mesh copper, nickel and gold grids. See the matrix below for the currently available TEM support films with packaging sizes of 25, 50 and 100/box.Grid MeshCarbon only TEM support films200 squareCu/ Ni / Au300 squareCu/ Ni / Au400 squareCu/ Ni / Au The FC - range Formvar Carbon support films are more robust than carbon only films. The formvar carbon TEM support films offer a good solution where a carbon only film only film would be too fragile to withstand pre-treatments and/or additional processing. They also provide the option to remove the formvar from the film before use.The formvar carbon TEM support films are available on 100, 200, 300 and 400 mesh copper, nickel and gold grids. See the matrix below for the currently available TEM support films with packaging sizes of 25, 50 and 100/box. Grid MeshFC – range Formvar Carbon TEM support films100 squareCu / Au200 squareCu / Au / Ni300 squareCu / Au / Ni400 squareCu / Au / Ni The HC range of Holey Carbon support films offer a pure carbon support film with a range of relatively small holes. Holey carbon films are especially suited for suspensions of viruses or nano particles. They offer a cost effective solution where a continuous carbon film is not desirable. About half of the supported area of the holey carbon support film still consists of carbon.The EMR holey carbon TEM support films are available on 200, 300 and 400 mesh copper, nickel and gold grids. See the matrix below for the currently available TEM support films with packaging sizes of 25, 50 and 100 holey carbon support films in a TEM grid box.Grid Mesh HC - range Holey Carbon TEM support films 200 squareCu/ Ni / Au300 squareCu/ Ni / Au400 squareCu/ Ni / Au200 mesh F1 finder gridCu400 mesh R7 finder gridCu

聚酰亚胺（Kapton）带具有低放气性能，是高真空应用的理想带。优异的电气和隔热性能，高介电强度。尽管使用温度范围规定为-75至+260°C，但聚酰亚胺（Kapton）胶带已成功地在-196至+400°C的温度范围内使用。此磁带的应用范围很广：印刷电路板焊接时的遮蔽真空镀膜的遮蔽（溅射、热蒸发、电子束、PVD）在高真空中保存样品或零件低温应用定位带变压器、线圈和电动机的电气绝缘。标准聚酰亚胺（Kapton）胶带的厚度为0.06 mm。对于需要更高强度的应用，聚乙烯胶带的厚度为0.08 mm和0.12 mm。宽度为3至50毫米，长度为33米。清洁直径为76毫米的塑料芯。Specifications of the single sided polyimide (Kapton) tapesTape thickness0.06 mm0.08 mm0.12 mmTape materialpolyimide (Kapton) AdhesiveSilicone adhesiveColorGold, amber to brownFilm thickness0.025 mm0.045 mm0.085 mmAdhesive thickness0.035 mm0.035 mm0.035 mmTotal tape thickness0.06 mm0.08 mm0.12 mmAdhesive strength6 N / 25mmTape strength200 kPa350kPa500kPaElongation at break60%60%55%Dielectric strength8000 VoltsUse temperature-75 °C to + 260 °CLength33 mCore diameter76mm (3”)Chemical resistanceExcellent to acids, solvents and oils 卡普顿和聚酰亚胺胶带双面聚酰亚胺耐热胶带 所述双面聚酰亚胺带由双面带有硅粘合剂的聚酰亚胺薄膜构成。胶带缠绕在两层聚酯衬里之间。两个衬垫使清洁处理胶带变得容易：切割到所需长度，从第一个衬垫上松开胶带并留在第二个衬垫上。贴上胶带并拆下第二层衬垫。胶带材料和粘合剂与单面聚酰亚胺（Kapton）胶带相同。宽度为5至50毫米，胶带长度为20米。清洁直径为76毫米的塑料芯。Specifications of the double sided polyimide (Kapton) tape:Tape materialpolyimideAdhesive Silicone adhesiveColorGold to amberFilm thickness0.025mmAdhesive thickness0.035mm (2x)Tape thickness0.095mm (without liner)Liner thickness0.1mm (2x0.05mm)Total tape thickness0.195 mm (with double liner)Adhesive strength6N / 25mmTape strength200 kPaElongation at break 60%Dielectric strength6.5 kVChemical resistanceExcellent to acids, oils and solventsUse temperature range-75 to +260 °CLength20mCore diameter76mm (3”)

上海屹持光电技术有限公司专业提供各种微纳结构加工服务典型案例： FIB加工微纳结构 紫外光刻微纳结构 单晶硅反应离子刻蚀图片 ICP 刻蚀微纳结构 纳米压印点线图微流控细胞打印 EBL 刻写微纳阵列 FIB 用于器件电极沉积 激光直写图案激光直写器件微纳结构加工主要设备 1，电子束曝光系统；2，聚焦离子束/ 扫描电子显微镜双束系统；3，双面对准接触式紫外光刻机；4， 单面对准紫外光刻机；5，金属高密度等离子体刻蚀机；6，硅刻蚀高密度等离子体刻蚀机； 7，反应等离子体刻蚀机；8，纳米压印机。

样品座The Em-Tec SEM stub adapters enable the use of all common types of SEM stubs or mounts in your SEM. Advantages of the cost-effective and practical EM-Tec SEM stub adapters are:sample mounting independent of SEM platformsave time with no need to re-mount samplesuse calibration and resolution standards mounted on different stubsno need to risk sample integrityenables collaborative investigation of samplesThere are basically 5 common types of SEM sample stubs:Standard pin stubs with standard 9.5mm long pin used on FEI, Philips, Tescan, Phenom, Aspex, RJ Lee, Cambridge Instruments, Leica, CamScan, ETEC and Novascan SEMs and SEM/FIB systemsZeiss pin stubs with short 6mm pin for Zeiss and LEO SEMs, CrossBeams and SEM/FIB systems Plain cylinder stubs for JEOL SEMs and SEM/FIB systemsHitachi cylinder stubs with M4 threaded base for Hitachi SEMs and FIBsPlain cylinder stubs for ISI, ABT, Topcon SEMsFor each of the above type mentioned SEM stubs there are EM-Tec SEM stub adapters available. The EM-Tec SEM stub adapters are essentially made with the base of one type of an SEM stub and a top compatible with another type of SEM sample stub. The EM-Tec SEM stub adaptors are all constructed of vacuum grade aluminium and made to original manufacturers specifications. The Hitachi stub extensions are made from self-lubricating brass with aluminium locking ring. EM-Tec SEM stub adapters types are available as:Pin stub adapters for using other SEM stubs in pin type SEMs such as FEI, Philips, Tescan, Phenom, Aspex, Cambridge Instruments, Leica, etc. These can be used in Amray systems as well.Short pin stub adapters for using other SEM stubs in Zeiss and LEO SEMsJEOL stub adapters for using other pin stubs and Hitachi stubs in JEOL SEMsHitachi M4 stub adapters for using pin stubs and JEOL stubs in Hitachi SEMsOther SEM stub adapters for less common SEMs such as ISI/ABT/Topcon and Agilent/KeysightMetal slide adapter to accommodate pin stubs on reflected light microscopesFor labs with multiple SEM platforms or for those who are regularly using diferent brands of SEMs, we offer the EM-Tec universal SEM stub adapter set. This universal SEM stub adapter set includes pin stub adapters, JEOL stub adapters (up to 25mm) and Hitachi stub adapters, all both ways. If you can' t find the SEM stub or mount adapter you are looking for, please contact us. We might be able to offer a different solution or can manufacture custom SEM stub adapters. Product #TypeBase isTop acceptsDimensionsEM-Tec stub adapters based on standard pin stubs for FEI, Philips, Tescan, Phenom, Aspex, Cambridge Instr.11-000109PR4?3.2 x 9.5mm pinHitachi M4 thread?9 x 15mm11-000119PT4?3.2 x 9.5mm pinHitachi M4 thread?4 x 13.5mm11-000205PS4?3.2 x 9.5mm pinCambridge S4 stub?30 x 19.5mm11-000210PH10?3.2 x 9.5mm pin?3.2x9.5mm pin?12.7 x 22.7mm11-000216PJ12?3.2 x 9.5mm pin?9.5/ ?12.2 mm JEOL stub?25 x 19.5mm11-000227PJ25?3.2 x 9.5mm pin?25mm JEOL stub?34 x 19.5mm11-000232PJ32?3.2 x 9.5mm pin?32mm JEOL stub?40 x 19.5mm11-000251PJ50?3.2 x 9.5mm pin?50mm JEOL stub?59 x 19.5mmEM-Tec stub adapters for Zeiss/LEO with short pin11-000106ZR4?3.2 x 6mm pinHitachi M4 thread?9 x 11.5mm11-000116Z4?3.2 x 6mm pinHitachi M4 thread?4 x 10mm11-000126ZJ12?3.2 x 6mm pin?9.5/ ?12.2 mm JEOL stub?25 x 16mm11-000127ZJ25?3.2 x 6mm pin?25mm JEOL stub?34 x 16mm11-000128ZJ32?3.2 x 6mm pin?32mm JEOL stub?40 x 16mm11-000129ZJ50?3.2 x 6mm pin?50mm JEOL stub?59 x 16mmEM-Tec stub adapters for JEOL and JEOL Neoscope11-000503 J10P?9.5 x 9.5mm?3.2x9.5mm pin?9.5 x 9.5mm11-000513 J12P?12.2 x 10mm?3.2x9.5mm pin?12.2 x 10mm11-000523 J25P?25 x 10mm?3.2x9.5mm pin?25 x 10mm11-000504 J10H?9.5 x 9.5mmHitachi M4 thread?9.5 x 13.5mm11-000514J12H?12.2 x 10mmHitachi M4 thread?12.2 x 14mm11-000524J25H?25 x 10mmHitachi M4 thread?25 x 14mmEM-Tec stub adapters for Hitachi SEMs and table top SEMs 11-000304H15PHitachi M4 thread?3.2x9.5mm pin?15 x 15mm 11-000305HS4Hitachi M4 threadCambridge S4 stub?30 x 10mm 11-000310HJ10Hitachi M4 thread?9.5mm JEOL stub?15 x 10mm11-000311HJ11Hitachi M4 thread?12.2mm JEOL stub?15 x 10mm11-000316HJ12Hitachi M4 thread?15mm JEOL stub?25x 10mm11-000326HJ25Hitachi M4 thread?25mm JEOL stub?34 x 10mm11-000332HJ32Hitachi M4 thread?32mm JEOL stub?40 x 10mm11-000351HJ50Hitachi M4 thread?50mm JEOL stub?59 x 10mm11-000309H10Hitachi M4 threadHitachi M4 thread?15 x 14mm11-000321HS12Hitachi M4 threadHitachi M4 thread?20 x 16mm11-000322HS18Hitachi M4 threadHitachi M4 thread?20 x 22mm11-000323HS25Hitachi M4 threadHitachi M4 thread?20 x 29mmEM-Tec stub adapter for Keysight/Agilent/Novelex 8500 and AmRay11-000120KR4?3.2 x 20mm pinHitachi M4 thread?30 x 19.5EM-Tec stub adapter for ISI/ABT/Topcon11-000604I15H?15 x 10mm stubHitachi M4 thread?15 x 14mmEM-Tec stub adapter for reflected light microscopes11-000675M31P76.2x25.4mm?3.2x9.5mm pin76.2 x 25.4 x 11.2mm

裸铜网 IntroductionThe high quality EM-Tec TEM support grids are designed as sturdy and stable support grids. They are available in a variety of materials to suit the application at hand. The materials are the standard copper, nickel, gold and molybdenum and additionally titanium, aluminium and stainless steel. There are two manufacturing processes used for the EM-Tec TEM support grids :Electro forming processes for copper, copper/rhodium, nickel and gold TEM grids for well-defined features and consistent quality with an average thickness of 25um.Electro etching processes for molybdenum, aluminium, titanium and stainless steel foils with a thickness of 25um, except titanium which is 15um and stainless steel which is 12um.After manufacturing the EM-Tec grids undergo a proprietary cleaning process to reduce contamination issues. All EM-Tec TEM grids are inspected for 100% quality assurance. The thickness of the EM-Tec TEM grids results in a more rigidand stable TEM grid for specimen support and specimen support films. The 375um wide rim contributes to a greater stiffness and makes handling and transportation of the grids much easier than grids with a narrower rim. The EM-Tec high quality TEM support grids are packaged in anti-static plastic vials with vials of 100 grids for Cu, Cu/Rh and Ni. The EM-Tec grids made from Au, Mo, Al, Ti and stainless steel are packaged in vials of 25 grids. They all have the standard 3.05mm diameter. Available patterns are:21-1M0150 EM-Tec TEM square mesh support grids, 150 Mesh, 125 μm hole, 44 μm bar,Copper21-1M0200 EM-Tec TEM square mesh support grids, 200 Mesh, 90 μm hole, 37 μm bar,Copper21-1M0300 EM-Tec TEM square mesh support grids, 300 Mesh, 54 μm hole, 31 μm bar ,Copper

低温网格盒 28-001004 EM-Tec CGB-4 Cryo grid box for 4 TEM grids The EM-Tec GB-4 cryo grid box is used with cryo vitrification systems. It is a round grid box with 4 diamond shaped positions, an index notch and a clear lid. The clear lid has a slot which can be rotated to access the cavities. It is held in place with a stainless steel #1 phillips pan head screw. The EM-Tec GB-4 cryo grid box is compatible with the FEI Vitrobot, Gatan CP3, Gatan 3500, Gatan 626 and Leica EM GP cryo systems. Dimensions of the EM-Tec GB-4 are ?14 x 5.2mm. Screw size is M3x5mm. For handling the cryo grid box in LN2 we offer the EM-Tec 553.AM cryo grid box tweezers. 28-001007 EM-Tec CGB-7 Cryo grid box for 4 TEM grids with pin type lidThe EM-Tec CGB-7 cryo grid box is used with cryo vitrification systems. It is a round grid box with 4 diamond shaped positions and a pin type lid. The EM-Tec CGB-7 cryo grid box is compatible with the FEI Vitrobot, Gatan CP3, Gatan 3500, Gatan 626 and Leica EM GP cryo systems.Dimensions of the EM-Tec CGB-7 are ?14 x 5.2mm, M3 thread. EM-Tec CGT1 gripper tool for cryo grid box with pin type lid. 28-001099 Gilder SB100 TEM grid storage box for 100 TEM gridsThe Gilder SB100 TEM grid storage box has a storage capacity for up to 100 standard 3.05mm TEM grids. This grid box has diamond shaped storage compartments and a clear plastic sliding lid with a window in the middle. The window in the lid reduces the amount of exposed grids. To improve grid handling the plastic boxes are made from anti-static materials anti-static ABS for the box and anti-static CAB polymer for the lid. The ridges on the front and back further reduce static and provide a better grip of the lid at the back. Each storage position is referenced by printed letters and numbers printed on the SB100 grid box. Dimensions of the Gilder SB100 TEM grid box are: 85 x 60 x 7mm. 28-002100 EM-Tec FSB100S FIB lift-out grid storage box with single clipThe EM-Tec FSB-100S FIB lift-out grid storage boxes consist of an anti-static tray to hold up to 100 FIB lift-out grids or 100 standard 3.05mm TEM grids. The grids are to be stored flat in the tray. The tray is made from anti-static black conductive polypropylene. Complete with a clear polystyrene cover to enable easy location of the grids. The grids are stored in a 10x10 individual storage compartments array with a flat on one corner as a reference. The tray and cover are held together with a single piece slide-on PE clip which holds the cover on two sides. Dimensions are 51 x 55 x 11mm stackable design with ridges and grooves.28-002200 EM-Tec FSB100D FIB lift-out grid storage box with pair of band clipsThe EM-Tec FSB-100D FIB lift-out grid storage boxes consist of an anti-static tray to hold up to 100 FIB lift-out grids or 100 standard 3.05mm TEM grids. The grids are to be stored flat in the tray. The tray is made from anti-static black conductive polypropylene. Complete with a clear polystyrene cover to enable easy location of the grids. The grids are stored in a 10x10 individual storage compartments array with a flat on one corner as a reference. The tray and cover are held together with a pair of PE band clips which assets more pressure in the centre of the cover to reduce the possibility of a gap. Preferred for transport and shipping. Dimensions are 51 x 55 x 11mm.Specifications and storage capacity of the TEM grid storage boxesProduct #NameCapacitySizeMaterials base + lid28-001001EM-Tec CG-1 1 TEM grid?14 x 11mmAluminium + Aluminium28-001100EM-Tec GB-100 100 TEM grids75 x 65 x 6.5mmReduced static ABS + PMMA28-001127EM-Tec TGB-100 100 TEM grids92 x 55 x 7mmAnti-static ABS + PMMA28-001125EM-Tec TGB-50 50 TEM grids74 x 38 x 7mmAnti-static ABS + PMMA28-001030EM-Tec GB-30 30 TEM grids76 x 25 x 6.5mmReduced static ABS + PMMA28-001004EM-Tec CGB-4 4 Cryo grids?14 x 7.3mmReduced static ABS + PMMA28-001014EM-Tec CGB-6 4 Cryo grids?14 x 9mmAnti-static polymer blend28-001007EM-Tec CGB-7 4 Cryo grids?14 x 14mmReduced static ABS28-001009EM-Tec CGB-4A 4 Cryo grids?14 x 7.3mmAluminium + Aluminium28-002004EM-Tec FA-4 4 FIB grids?14 x 11mmAluminium + Aluminium28-002100EM-Tec FSB-100S 100 FIB grids51 x 55 x 11mmConductive PP + PS / PE clip28-002200EM-Tec FSB-100D 100 FIB grids51 x 55 x 11mmConductive PP + PS / PE clips28-001099Gilder SB100 100 TEM grids85 x 60 x 7mmAnti-static ABS + antistatic CAB28-001050Gilder SB50 50 TEM grids75 x 65 x 7mmAnti-Static ABS + antistatic CAB28-001025Gilder SB2525 TEM grids53 X 36 X 6mmAnti-Static ABS + Polycarbonate

样品台The EM-Tec stub based SEM sample holders are all small SEM sample holders based on (modified) SEM sample stubs. They have the same footprint as the original SEM sample stubs and are directly compatible with the SEM stage or SEM sample stub holder. These affordable sample holders increase efficiency and reduce sample preparation time. Using sample holders reduces the use of conductive adhesives which can be a source of contamination. The EM-Tec stub based small sample holders formats are:Standard pin stub based compact sample holdersJEOL cylinder stub based sample holdersHitachi M4 stub based sample holders Capacity, stub size and sample holding method of the EM-Tec pin stub based compact sample holdersProduct #StyleCapacity Size w/o pinSample holding method12-000117EM-Tec PS20 – ?2mm?6x4mmSet screw10-002212EM-Tec PS32mm thickness?12.7x3.2mmScrew/washer10-002240EM-Tec PS40 – 4mm ?12.7x7.2mmSet screw10-002244EM-Tec PS444 x 0-4mm ?25.4x7.2mm4 x Set Screw10-002218EM-Tec PS60 – 6mm ?12.7x7.2mmMini vise jaws12-000230EM-Tec PS90 – 8mm ?15x10mmMini vise jaws10-002242EM-Tec PS72 x 1mm ?15x10mmSet screw12-000112EM-Tec PS120 – 12mm ?25x7.2mmSet Screw10-002213EM-Tec PS50 – ?3.5mm ?12.7x7.2mmSet Screw10-002216EM-Tec PS80 – ?6mm ?12.7x7.2mmSet Screw12-000116EM-Tec PS160 – ?16mm ?25x7.2mmSet Screw10-002211EM-Tec PS111 x 3.05mm Grid ?12.7x3.2mmGravity10-002214EM-Tec PS144 x 30.5mm Grid ?12.7x3.2mmGravity11-000210EM-Tec PE10?3.2mm pin ?12.7x13.2mmSet screw12-000211EM-Tec PS15?15mm ?15x15mmAdhesive12-000270EM-Tec F122 x FIB grid ?12.7x8mmVise jaws10-002236EM-Tec P36?3.2mm pin ?12.7x17mmSet screw10-002238EM-Tec P38?3.2mm pin ?12.7x17mmSet screw10-002245EM-Tec P45?3.2mm pin ?12.7x17mmSet screw10-002246EM-Tec P45MM4 ?12.7x17mmM4 thread10-002270EM-Tec P70?3.2mm pin ?12.7x20mmSet screw10-002274EM-Tec P70MM4?12.7x20mmM4 thread The standard Hitachi stubs use an M 4 threaded hole in the base of the stubs. Our comprehensive selection of Hitachi M4 sample stubs include sizes from 15mm up to 100mm diameter to support virtually all applications. The Hitachi M4 SEM sample stubs are all made from vacuum grade aluminium. They are manufactured according to the original Hitachi specifications and are fully compatible with the standard Hitachi sample stub holders and stage adapters. Hitachi ?25x6mm M4 cylinder SEM sample stub, satin finish, aluminium Standard Hitachi stubs with 25.4mm diameter x 6mm thickness and M4 threaded hole. These ?25.4mm Hitachi stubs have undergone a surface finish treatment to give them a more satin look and to remove machining marks. Dimensions are fully compatible with standard 25.4mm Hitachi stubs. Offered against a reduced price in packs of 50 and 100.

样品台The EM-Tec stub based SEM sample holders are all small SEM sample holders based on (modified) SEM sample stubs. They have the same footprint as the original SEM sample stubs and are directly compatible with the SEM stage or SEM sample stub holder. These affordable sample holders increase efficiency and reduce sample preparation time. Using sample holders reduces the use of conductive adhesives which can be a source of contamination. The EM-Tec stub based small sample holders formats are:Standard pin stub based compact sample holdersJEOL cylinder stub based sample holdersHitachi M4 stub based sample holders Capacity, stub size and sample holding method of the EM-Tec pin stub based compact sample holdersProduct #StyleCapacity Size w/o pinSample holding method12-000117EM-Tec PS20 – ?2mm?6x4mmSet screw10-002212EM-Tec PS32mm thickness?12.7x3.2mmScrew/washer10-002240EM-Tec PS40 – 4mm ?12.7x7.2mmSet screw10-002244EM-Tec PS444 x 0-4mm ?25.4x7.2mm4 x Set Screw10-002218EM-Tec PS60 – 6mm ?12.7x7.2mmMini vise jaws12-000230EM-Tec PS90 – 8mm ?15x10mmMini vise jaws10-002242EM-Tec PS72 x 1mm ?15x10mmSet screw12-000112EM-Tec PS120 – 12mm ?25x7.2mmSet Screw10-002213EM-Tec PS50 – ?3.5mm ?12.7x7.2mmSet Screw10-002216EM-Tec PS80 – ?6mm ?12.7x7.2mmSet Screw12-000116EM-Tec PS160 – ?16mm ?25x7.2mmSet Screw10-002211EM-Tec PS111 x 3.05mm Grid ?12.7x3.2mmGravity10-002214EM-Tec PS144 x 30.5mm Grid ?12.7x3.2mmGravity11-000210EM-Tec PE10?3.2mm pin ?12.7x13.2mmSet screw12-000211EM-Tec PS15?15mm ?15x15mmAdhesive12-000270EM-Tec F122 x FIB grid ?12.7x8mmVise jaws10-002236EM-Tec P36?3.2mm pin ?12.7x17mmSet screw10-002238EM-Tec P38?3.2mm pin ?12.7x17mmSet screw10-002245EM-Tec P45?3.2mm pin ?12.7x17mmSet screw10-002246EM-Tec P45MM4 ?12.7x17mmM4 thread10-002270EM-Tec P70?3.2mm pin ?12.7x20mmSet screw10-002274EM-Tec P70MM4?12.7x20mmM4 thread The standard Hitachi stubs use an M 4 threaded hole in the base of the stubs. Our comprehensive selection of Hitachi M4 sample stubs include sizes from 15mm up to 100mm diameter to support virtually all applications. The Hitachi M4 SEM sample stubs are all made from vacuum grade aluminium. They are manufactured according to the original Hitachi specifications and are fully compatible with the standard Hitachi sample stub holders and stage adapters. Hitachi ?25x6mm M4 cylinder SEM sample stub, satin finish, aluminium Standard Hitachi stubs with 25.4mm diameter x 6mm thickness and M4 threaded hole. These ?25.4mm Hitachi stubs have undergone a surface finish treatment to give them a more satin look and to remove machining marks. Dimensions are fully compatible with standard 25.4mm Hitachi stubs. Offered against a reduced price in packs of 50 and 100.

DNACore AAV-SEC色谱柱采用单分散、高孔容硅胶微球，孔径经过特殊优化，结合独特的表面亲水化学修饰而成，具备良好的分离选择性，适用于不同血清型AAV聚集体分析。特性：分离选择性佳，普适性强柱效高，非特异性吸附低微球机械强度高，柱寿命长良好柱间一致性参数：产品名称DNACore AAV-SEC色谱柱官能团二醇基基质单分散、高孔容、多孔硅胶微球 粒径3 µ m孔径保密常用规格 7.8×300 mm 7.8×150 mm4.6×300 mm4.6×150 mm耐压上限3000 psi耐温上限 40 °CpH范围 2 - 8应用领域不同血清型AAV聚集体分析DNACore AAV-SEC色谱柱技术：不同血清型聚集体分析：不同血清型聚集体分析-高通量：批次间一致性：DNACore AAV-SEC色谱柱可以为不同血清型AAV聚集体分析提供良好分离选择性，批次间一致性佳，普适性强，是AAV聚集体分析的强有力工具。产品货号信息：Product NameParticle Size(µ m)Length(mm)ID (mm)7.84.6DNACore AAV-SEC3300D203-030AAV-07830SD203-030AAV-04630S150D203-030AAV-07815SD203-030AAV-04615S

纳米颗粒分析仪配件用于观测和分析液体中的微小颗粒的布朗运动速率与尺寸分布相关，采用纳米颗粒跟踪分析（NTA）技术，通过激光散射装置（纳米观测）与超显微镜ultra-microscope和NTA软件的相结合，生成纳米颗粒图像，是全球领先的纳米粒度分析仪。纳米颗粒分析仪配件 纳米观测原理 纳米颗粒分析仪使用纳米透视Nano-Insight 激光散射模块，可以通过顶眼超显微镜观测到液体中的纳米粒子。采用不同激光散射颗粒在矩阵中表现为模糊点。模糊点根据其各自的布朗运动而移动。液体中有不同的布朗运动粒子。小粒子比大粒子受到相邻粒子的影响更少。因此，在超显微图像中，较大的粒子有大的模糊外观。 NTA能够追踪粒子的相应路径。 纳米观测模块 纳米观测模块的设计，可以使其安装在超显微镜，顶眼纳米的底板。可以通过Mishell软件来控制该模块。Mishell软件控制着纳米观测模块以及照相机。根据应用决定在纳米观测模块装备一个或多个激光器。激光器以一种特殊的方式排列。左侧图片上展示的是纳米观测图。较小的粒子比较大的粒子移动更快。我们用摄像机同时跟踪每个粒子。 顶眼超显微镜 顶眼超显微镜将进入模糊点的散射光可视化。用适当的时间分辨跟踪，模糊云可被分配并与各自的粒径相关。粒子的布朗运动图像是唯一的。下面将给出例子。每个模糊点代表单个粒子。 NTA 软件 上图展示的是NTA分析的典型图像。散射激光被捕获到模糊点，要根据时间函数跟踪模糊点。我们跟踪每个模糊点。跟踪每个粒子的方法，得到的技术结果是高分辨率。我们正在寻找与图像相关的量，当我们知道相关的量后，我们就可以极其精确地确定各种粒子的浓度。该技术将会带起许多可能的应用。例如，可能也可以使用荧光激光器。使用荧光激光器，可以瞄准复杂的基质里的一个粒子。该技术带来的好处是，用户可以在视觉上检查并且通过观察相应图像验证所有可能的应用。 MiNan是Mishell® 内的一个模块- 扩展图像分析软件包，被认为是市场上最先进的图像分析软件。MiNan是一个子程序，可以进行Morphious纳米粒子分析的全部描述。 MiNan是自带Morphious纳米系统的软件，研发用于纳米粒子的可视化以及纳米粒子的大小、形状（形态）和浓度的测量。每个粒子是一个个体，但通过观测扩散同时被分析。这种一个粒子后接一个粒子的方法产生高分辨率的结果，即粒子的尺寸分布和浓度分辨率高，同时视觉验证让用户对数据有了额外的信心。当荧光模式检测标记粒子时，粒子尺寸和浓度，蛋白质聚集和粘度都可以被分析。 纳米颗粒分析仪配件应用 ? 在制药或复合产业研发药物 ? 用于病毒筛查 ? 用于开发纳米生物标记物或毒物筛查 ? 用于蛋白质聚集的动力学模型研究 ? 用于通过膜泡的表征研究疾病 ? 用于促进纳米复合材料的发展 纳米颗粒分析仪配件特色 ? 在同一时间多粒子高通量表征 ? 实时视觉展示粒子，允许用户评估试验，无需额外复杂性 ? 方便和易于使用的软件，允许用户通过宏设置任何实验 ? 添加像高通量自动采样器，泵或加热和制冷配件 ? 自适应模块化系统构建任何复杂的应用程序，操作轻松舒适 ? 超级高效和购买成本低 ? 该系统提供高分辨率的粒度特性来研究复杂的多分散矩阵 ? 激光波长可选择 ? 通过给过滤器添加电动轮，得到自适应荧光分析 纳米颗粒分析仪配件参数 ? 尺寸 10 nm - 2000 nm* ? 浓度 106 - 109 粒子/ mL ? 荧光检测 纳米颗粒分析仪配件规格 温度范围 15-40 °C 电源 230V AC/115V AC, 50/60 Hz 摄像机 USB3 CMOS分辨率：1936x1216 161帧/秒，像素尺寸5.86μm：颜色校准模块 功耗 18W 激光波长 405nm（紫色），488nm（蓝），532nm（绿），642nm（红色） 尺寸范围 从10 nm到2000 nm (取决于材料) 焦点 电脑控制电动调焦 个人计算机 SDD亿康 II SDSSDHII-120G-G25HDD 西数蓝WD10EZEX1 TB|主板千兆字节 GA-Z97X-UD3H|内存金士顿骇客神条怒黑| HX318C10FBK2/1616 GB DDR3-RAM 处理器 英特尔® 酷睿™ i7 i7-4790K四核4×4.0 GHz 显卡 PNY VCQK2200-PB 4GB 电源 酷冷至尊 G750M 750w 机箱 酷冷至尊黑 软件 Windows® ＆（或更高）.由Mishell® 供电 Mishell是Microptik BV公司的注册商标。 Windows是微软公司的注册商标。 MiNan尖端程序在Mishell下运行，以充分体现由Morphious纳米获得的纳米粒子 尺寸（长×宽×高） 20 x 18 x 30 cm 重量 10.5 kg

为了满足食品饮料及制药行业中多糖类物质（如淀粉、纤维素、糖原、戊糖、半乳糖、纤维二糖、葡萄糖、甘露醇、乙酸等）的分析需求，纳谱分析专门开发了广受客户赞誉的以单分散聚合物微球为基质的糖类分析色谱柱。ChromCore多糖分析色谱柱采用两种不同粒径的PS/DVB单分散微球基质，通过独特的磺化键合工艺形成氢型、钠型、钙型这三类基于配位交换原理的高选择性多糖分析色谱柱，以满足不同类型多糖、糖醇和有机酸的分析需求。目前有ChromCore Sugar-10H、ChromCore Sugar-10Ca、ChromCore Sugar-10Na三种类型。特性：低交联度的PS/DVB基质的Na型配体交换糖分析专用柱高分辨率，良好的化学稳定性，兼容100%水相，批间重现性佳适用于含有大量无机Na离子的化合物，如蜂蜜及其它低聚糖的分析参数：产品名称Sugar-10HSugar-10CaSugar-10Na官能团-SO3H-(SO3)2Ca-SO3Na基质单分散高纯PS/DVB粒径6 & 8 μmCross-linking10%耐压上限1200 psi耐温上限95 ℃pH范围1-35-95-9应用有机酸与混合醇糖类与甘露醇蜂蜜与其他低聚糖订货信息：货号名称规格A058-060010-07830SChromCore Sugar-10Na色谱柱6μm, 7.8×300mmA058-060010-04625SChromCore Sugar-10Na色谱柱6μm, 4.6×250mmA058-080010-07830SChromCore Sugar-10Na色谱柱8μm, 7.8×300mmA058-080010-04625SChromCore Sugar-10Na色谱柱8μm, 4.6×250mm

DNACore AAV-Q色谱柱采用单分散、无孔PS/DVB微球，结合独特的表面亲水化学修饰而成，具备良好的分离选择性，适用于不同血清型AAV空壳/实心率分析。特性：分离选择性佳柱效高，非特异性吸附低货号微球机械强度高，柱寿命长，耐受性好 良好柱间一致性参数：产品名称DNACore AAV-Q色谱柱官能团季铵基基质单分散、无孔、PS/DVB微球粒径10 µ m孔径无孔常用规格4.6×50 mm 4.6×100 mm耐压上限4500 psi耐温上限 60 °CpH范围 2 - 12应用领域不同血清型AAV空壳/实心率分析货号信息：Product NameParticle Size(µ m)Length(mm)ID (mm) 4.6DNACore AAV-Q10 μm 4.6×50 mmD301-100AAV-04605P 4.6×100 mmD301-100AAV-04610PDNACore AAV-Q色谱柱技术： AAV2-线性梯度 vs 台阶梯度：AAV5-线性梯度 vs 台阶梯度：AAV6-线性梯度 vs 台阶梯度：AAV8-线性梯度 vs 台阶梯度：批次间一致性： 使用AAV5对三个不同批次的DNACore AAV-Q色谱柱进行测试评估，谱图中三个不同批次色谱柱得到的空壳和实心AAV出峰时间、峰形和分离度等基本一致（RSD3%），表明DNACore AAV-Q色谱柱良好的批次间一致性。

Rtx-1PONA 熔融石英毛细柱（专门用于烃类分析）（无极性固定相，交联100％二甲基聚硅氧烷）满足ASTM 和CGSB 对细分烃类分析的要求热稳定温度范围340°C.Rtx-1 PONA 聚合物是专门设计用于特别极性的场合，解决大部分石油化工公司烃类排序分析的要求。为了满足ASTM 和CGSB 对分离度和保持力的需求，Restek 为Rtx?-1PONA 设计了独特的品控测试和详细说明。Rtx-1PONA 的保持力，效率和固定相的选择性经过严格的控制，因此每根色谱柱都能满足ASTM 和CGSB 的要求类似固定相：Petrocol DH, DB-Petro,HP-PONA订货信息：货号名称规格10146-6850Rtx-1PONACap.Column50m,0.20mmID,0.50umForHP685010186Rtx-1PONACap.Column50m,0.25mmID,0.5um10195-146Rtx-1PONACap.Column2x50m,0.25mmID,0.50um10195-146280Rtx-1PONACap.Column2x50m,0.25mmID,0.50umRecoilin4"StarCage10195-1466850Rtx-1PONACap.Column2x50m,0.25mmID,0.50umForHP6850GCs10195-6850Rtx-1PONACap.Column100m,0.25mmID,0.50um5"CageforHP6850GCs10197Rtx-1PONACap.Column150m,0.25mmID,0.5um10195Rtx-1PONACapColumn100m,0.25mmID,0.50um

SEM样品台适配器The EM-Tec versatile SEM stage adapters are all designed to original SEM manufacturer' s specifications and are compatible with all M4 threaded EM-Tec SEM sample holders. The EM-Tec versatile stage adapters enable access to an unprecedented choice of SEM sample holders which can be used across multiple SEM platforms. Features of the EM-Tec versatile SEM stage adapters are:Access to all EM-Tec SEM sample holders with M4 thread (incl. Hitachi sample holders and Hitachi stubs)Use the same SEM sample holders across SEM platforms by simply changing the SEM stage adaptersExamine the same sample on different SEM platformsProtect your investment in custom and special SEM sample holdersCost savings for labs with multiple SEMsCost-efficient replacement for worn out original SEM stage adaptersUse onecalibration standard or resolution standard across multiple SEMs Overview of the available EM-Tec stage adapters with M4 screwFEI / Philips stage M6 fineZeiss/LEO dovetail JEOL 35/6300 dovetailJEOL 6400/5800 dovetailJEOL 6000/5000 dovetailJEOL 7000/6000 dovetailHitachi S4800 new T-baseHitachi S4000 old style T-baseHitachi SU5000 dovetailHitachi SU3500 dovetailHitachi S3400 dovetailHitachi S3700 dovetailHitachi S3000 roundHitachi TM series table top SEMPemtron pin with flatJEOL NeoScope discPin stub adaptersHirox SH-4000 with M4 thread

小 RNA 试剂盒专用于 microRNA 和小 RNA 的质量控制。小 RNA 的分析对小 RNA NGS 文库等下游应用必不可少。小 RNA 分子量标准品包含 15 到 200 nt 的 6 个片段，可实现小 RNA 和 microRNA 准确精密的定量分析和分子量测定。专注 200 nt 的小范围可以使 microRNA（10 到 40 nt）和小 RNA（40 到 200 nt）的各个区域放大，从而实现高分离分辨率和每个区域的详细分析。 较宽的浓度范围 — 小 RNA 试剂盒的浓度范围为 25 至 2500 pg/µL分析时间短 — 分析时间仅需 22 分钟可靠的分子量测定 — 分子量范围从 15 到 200 nt，确保小 RNA 样品准确精密的分子量测定低样品量 — 仅需 2 µL 样品，可最大程度减少 QC 步骤的样品损失特异性 RNA 分析模式 — ProSize 数据分析软件利用特定的小 RNA 分析区域功能自动计算 microRNA 百分比，并对 microRNA 和小 RNA 进行定量分析毛细管阵列 — 针对 12 毛细管阵列进行优化

DNACore C18是一款以先进的单分散硅胶为基质，结合独特的表面修饰和键合技术而成的高性能色谱柱，适用于寡核苷酸类化合物分析。纳谱分析 生物分离色谱柱 DNACore 1000 C18色谱柱 特性：对寡核苷酸选择性好、分离度高；先进的单分散微球技术，柱效高；经寡核苷酸标准品严格质检，批次间一致性佳；两种孔径，满足不同分子量寡核苷酸分析纳谱分析 生物分离色谱柱 DNACore 1000 C18色谱柱 参数：产品名称DNACore 1000 C18官能团十八烷基基质单分散高纯硅胶微球粒径3 & 5 μm孔径1000 &angst 耐压上限5000 psi for 5 μm6000 psi for 3 μm耐温上限50 ℃pH范围2-11纳谱分析 生物分离色谱柱 DNACore 1000 C18色谱柱 订货信息：货号名称规格D003-050100-04625SDNACore 1000 C18色谱柱5μm, 4.6×250mmD003-050100-04615SDNACore 1000 C18色谱柱5μm, 4.6×150mmD003-050100-04615SDNACore 1000 C18色谱柱5μm, 4.6×100mmD003-050100-04605SDNACore 1000 C18色谱柱5μm, 4.6×50mmD003-050100-02115SDNACore 1000 C18色谱柱5μm, 2.1×150mmD003-050100-02110SDNACore 1000 C18色谱柱5μm, 2.1×100mmD003-050100-02105SDNACore 1000 C18色谱柱5μm, 2.1×50mm