Spectroscopic ellipsometry is a powerful technique for high accuracy characterization of the thickness and optical constants of GeSbTe multilayer systems for rewritable optical disc applications.It was shown that measurement in the NIR range gives better accuracy for the analysis of these types of material. The use of the multiple sample analysis reduces parameter correlations and errors for the thinnest layers.Owing to the advanced modelling features included in the DeltaPsi2 software, it is a straightforward procedure to analyze such structures even with layers deposited on both sides of the substrate.
最基本形式的拉伸测试是测量样品在破裂之前可以承受的最大力。有两种主要用于织物拉伸测试的配置:条带法 (ISO 13934-1) 和抓握法 (ISO 13934-2)。这些方法计算最大力和在该最大力下的伸长率。它们主要适用于纺织品,而不是不织布、弹力织物或涂层织物;这些材料有替代标准。在这两个测试中,在边缘或钳口处断裂的样本结果应丢弃。