The M5513 is an all-inclusive memory test system for next-generation DDR5 multiplexed-rank dual inlinememory modules (MR-DIMM). Operating at blisteringly fast speeds, this test system is an ideal solution for longtermDIMM development and test. It contains a complete side-band bus controller and provides full access to allcommand, address, and data pins on a standard 288-pin DIMM under test. The M5513 can characterize the DDRinterface at its maximum speed, and it can also perform exhaustive memory read-write testing and functionalstress testing. A true ATE-on-Bench, the M5513 reduces cost and enhances interoperability of DDR5 systems.
留言咨询