FTIR在材料和半导体领域研究和发展
FT/IR-4000, 6000 series?? IRT-5000/7000 system??* O2/N2 concentrationmeasurementinside of Si wafer* Hydrogen??terminated evaluationon Si wafers* Quantitative/ Qualitativemeasurement of highlypolymerized compounds ??* Dynamic analysis of liquidcrystal materials ??* Reflectance of solar radiation onglass??* Gas phase analysis ??