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供应商1
生产商+经销商
产品1
仪器+消耗品/配件
品牌溯源
发源地:美洲/美国
品牌简介
MTIInstrumentsisaworldwidesupplierofprecisionnon-contactphysicalmeasurementsolutions,conditionbasedmonitoringsystems,portablebalancingequipmentandsemiconductorwaferinspectiontools.MTIInstruments’productsuseacomprehensivearrayoftechnologiestosolvecomplexrealworldapplicationsinnumerousindustriesincludingmanufacturing,semiconductor,commercial/militaryaviation,automotiveanddatastorage.Ourproductsoffernoncontactmeasurementtodeterminetiretreaddepth,diskandrotorrunout,waferflatnessandcharacterization,weldandseamtracking,ultrasonichornvibration,roboticlaserinspection,andmanymoreapplications.Whenitcomestoelectronicgauginginstrumentsforposition,displacementandvibrationapplicationswithinthedesign,manufacturing/production,QA/QCtestandresearchmarketssemiconductorproductsforwafercharacterizationofsemi-insulatingandsemi-conductingwafersandenginebalancingandvibrationanalysisforbothmilitaryandcommercialaircraft,MTIInstrumentshastherighttoolsforyou. MTIInstrumentsisveryproudofthecrucialroleitplayedwithmanyoftheworld’slargestcompanieswhetherit’sinbasicresearch,improvedefficiencyduringproductionorqualitycontrolbyofferingsolutionsdirectlytotheend-useroranembeddedtechnologyforleadingOEMsuppliers.WhateveryoutouchhasprobablybeenmeasuredbyMTIInstruments. ISO9001:2008certified SemiconductorMetrologySystems MTIInstruments'semiconductorwafermetrologytoolsconsistofacompletelineofwafermeasurementsystemsforvirtuallyanymaterialincludingSiliconwafer(Si),GalliumArsenidewafer(GaAs),Germaniumwafer(Ge)andIndiumPhosphidewafer(InP).Frommanualtosemi-automatedwaferinspectionsystems,theProformalineofwafermetrologyinspectiontoolsisidealforwaferthickness,waferbow,waferwarp,resistivity,siteandglobalflatnessmeasurement.Ourproprietarypush/pullcapacitanceprobesprovideoutstandingaccuracythroughouttheirlargemeasurementrange,allowingmeasurementofhighlywarpedwafersandstackedwafers.MTII'ssolarmetrologytoolsincludeofflinemanualsystemsforwaferthicknessandTotalThicknessVariation(TTV),aswellas,in-processmeasurementsystemscapableofmeasuringwaferthickness,TTVandwaferbowatthespeedof5wafers/second.
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