供应统计

供应商1

生产商+经销商

产品1

仪器+消耗品/配件

品牌溯源

发源地:美洲/美国

品牌简介

MTIInstrumentsisaworldwidesupplierofprecisionnon-contactphysicalmeasurementsolutions,conditionbasedmonitoringsystems,portablebalancingequipmentandsemiconductorwaferinspectiontools.MTIInstruments’productsuseacomprehensivearrayoftechnologiestosolvecomplexrealworldapplicationsinnumerousindustriesincludingmanufacturing,semiconductor,commercial/militaryaviation,automotiveanddatastorage.Ourproductsoffernoncontactmeasurementtodeterminetiretreaddepth,diskandrotorrunout,waferflatnessandcharacterization,weldandseamtracking,ultrasonichornvibration,roboticlaserinspection,andmanymoreapplications.Whenitcomestoelectronicgauginginstrumentsforposition,displacementandvibrationapplicationswithinthedesign,manufacturing/production,QA/QCtestandresearchmarketssemiconductorproductsforwafercharacterizationofsemi-insulatingandsemi-conductingwafersandenginebalancingandvibrationanalysisforbothmilitaryandcommercialaircraft,MTIInstrumentshastherighttoolsforyou. MTIInstrumentsisveryproudofthecrucialroleitplayedwithmanyoftheworld’slargestcompanieswhetherit’sinbasicresearch,improvedefficiencyduringproductionorqualitycontrolbyofferingsolutionsdirectlytotheend-useroranembeddedtechnologyforleadingOEMsuppliers.WhateveryoutouchhasprobablybeenmeasuredbyMTIInstruments. ISO9001:2008certified SemiconductorMetrologySystems MTIInstruments'semiconductorwafermetrologytoolsconsistofacompletelineofwafermeasurementsystemsforvirtuallyanymaterialincludingSiliconwafer(Si),GalliumArsenidewafer(GaAs),Germaniumwafer(Ge)andIndiumPhosphidewafer(InP).Frommanualtosemi-automatedwaferinspectionsystems,theProformalineofwafermetrologyinspectiontoolsisidealforwaferthickness,waferbow,waferwarp,resistivity,siteandglobalflatnessmeasurement.Ourproprietarypush/pullcapacitanceprobesprovideoutstandingaccuracythroughouttheirlargemeasurementrange,allowingmeasurementofhighlywarpedwafersandstackedwafers.MTII'ssolarmetrologytoolsincludeofflinemanualsystemsforwaferthicknessandTotalThicknessVariation(TTV),aswellas,in-processmeasurementsystemscapableofmeasuringwaferthickness,TTVandwaferbowatthespeedof5wafers/second.