【序号】: 2 【作者】:Jerry Edelstein, Michael C. Hettrick, Stanley Mrowka, Patrick Jelinsky, and Christopher Martin 【题名】:Extreme UV measurements of a varied line-space Hitachi reflection grating: efficiency and scattering 【期刊】: Applied Optics 【年、卷、期、起止页码】:1984年 23卷 3267-3270页 【全文链接】: http://www.opticsinfobase.org/abstract.cfm?uri=ao-23-19-3267_1