【序号】:1 【作者】:Wayne E. King1, Geoffrey H. Campbell1, Alan Frank1, Bryan Reed1, John F. Schmerge2, Bradley J. Siwick3, Brent C. Stuart4, and Peter M. Weber5 【题名】:Ultrafast electron microscopy in materialsscience, biology, and chemistry 【期刊】:J. Appl. Phys. 97,111101 (2005) 【全文链接】:http://apl.aip.org/resource/1/applab/v89/i4/p044105_s1?isAuthorized=no
【序号】:2 【作者】:T. LaGrange1, M. R. Armstrong1, K. Boyden1, C. G. Brown1, G. H. Campbell1, J. D. Colvin1, W. J. DeHope1, A. M. Frank1, D. J. Gibson1, F. V. Hartemann1, J. S. Kim1, W. E. King1, B. J. Pyke1, B. W. Reed1, M. D. Shirk1, R. M. Shuttlesworth1, B. C. Stuart1, B. R. Torralva1, andN. D. Browning2 【题名】:Single-shotdynamic transmission electron microscopy 【期刊】:Appl. Phys. Lett. 89, 044105 (2006) 【全文链接】:http://apl.aip.org/resource/1/applab/v89/i4/p044105_s1?isAuthorized=no