【序号】： 1 【作者】： C. Battistoni, G. Mattogno, G. Righini 【题名】： Internal analyser inelastic scattering effects in XPS quantitative analysis 【期刊】： Surface and Interface Analysis, Volume 22, Issues 1-12, Pages 98-102 (July 1994) 【全文链接】：http://onlinelibrary.wiley.com/doi/10.1002/sia.740220124/pdf
【序号】： 2 【作者】： A. Arranz, C. Palacio 【题名】： Factor analysis, a useful tool for solving analytical problems in AES and XPS: A study of the performances and limitations of the indicator function 【期刊】： Surface and Interface Analysis, Volume 22, Issues 1-12, Pages 93-97 (July 1994) 【全文链接】：http://onlinelibrary.wiley.com/doi/10.1002/sia.740220123/pdf
【序号】： 3 【作者】： K. Goto, N. Sakakibara, Y. Takeichi, Y. Numata, Y. Sakai 【题名】： True Auger spectral shapes: A step to standard spectra 【期刊】： Surface and Interface Analysis, Volume 22, Issues 1-12, Pages 75-78 (July 1994) 【全文链接】：http://onlinelibrary.wiley.com/doi/10.1002/sia.740220119/pdf
【序号】： 4 【作者】： C. Chemelli 【题名】： Chemical information from Auger data using factor analysis: Some examples 【期刊】： Surface and Interface Analysis, Volume 22, Issues 1-12, Pages 60-64 (July 1994) 【全文链接】：http://onlinelibrary.wiley.com/doi/10.1002/sia.740220116/pdf
【序号】： 5 【作者】： A. Jablonski, B. Lesiak, L. Zommer, A. Bilinski, A. Józwik 【题名】： Application of electron spectroscopies aided by the pattern recognition method for quantitative analysis of solid surfaces 【期刊】： Surface and Interface Analysis, Volume 22, Issues 1-12, Pages 41-44 (July 1994) 【全文链接】：http://onlinelibrary.wiley.com/doi/10.1002/sia.740220112/pdf
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