二硒化钨晶体 WSe2(Tungsten Diselenide)-P型
晶体尺寸：~10毫米
电学性能：半导体，P型
晶体结构：六边形
晶胞参数：a = b = 0.328 nm, c = 1.298 nm, α = β = 90°, γ = 120°
晶体类型：合成
晶体纯度：＞99.995%
X-ray diffraction on a WSe2 single crystal aligned along the (001) plane. XRD was performed at room temperature using a D8 Venture Bruker. The 5 XRD peaks correspond, from left to right, to (00l) with l = 2, 4, 6, 8, 10
Powder X-ray diffraction (XRD) of a single crystal WSe2. X-ray diffraction was performed at room temperature using a D8 Venture Bruker.
Stoichiometric analysis of a single crystal WSe2 by Energy-dispersive X-ray spectroscopy (EDX).
Raman spectrum of a single crystal WSe2. Measurement was performed with a 785 nm Raman system at room temperature.
