其他理化分析>其他检测 | AN1017_Preparaing lamellae with Backside Thinning with the OmniProbe 400...-牛津仪器科技（上海）有限公司

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应用领域	钢铁/金属
检测样本	其他
检测项目	理化分析>其他
参考标准	无

Introduction When preparing a TEM lamella in focused ion beam (FIB), curtaining is a common obstacle. Curtaining is a roughness on the lamella as a result of non-uniform thinning which critically affects the quality of analytical data collected, in addition to the ability to image and thin the lamella. A common cause of curtaining is the presence of different materials with a range of milling rates. The solution we discuss here to reduce curtaining is to change the orientation in which a lamella is ion beam polished/thinned by using the rotation function of the OmniProbe 400 nanomanipulator.

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聚焦离子束扫描电镜用纳米操纵手牛津仪器Omniprobe
型号：OmniProbe

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Introduction

When preparing a TEM lamella in focused ion beam (FIB), curtaining is a common obstacle. Curtaining is a

roughness on the lamella as a result of non-uniform thinning which critically affects the quality of analytical data

collected, in addition to the ability to image and thin the lamella. A common cause of curtaining is the presence of

different materials with a range of milling rates. The solution we discuss here to reduce curtaining is to change the

orientation in which a lamella is ion beam polished/thinned by using the rotation function of the OmniProbe 400

nanomanipulator.

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