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Transistor leadframes were characterized by contact angle analysis using an FTÅ135. The leadframes were attached to their original stamping strip and it was desired to make the measurements without detachment. The FTÅ instrument demonstrated its ability to measure on "real world" samples. The resulting images were complex but the Region of Interest (ROI) capability allowed most of the image to be excluded so the correct drop profile could be determined.
n型Sb合金SnSe热电多晶中纳米结构和导热系数降低的证据
用于太阳能集热器的具有增强热性能和机械性能的石墨烯结合铝
塑料共混物对油棕空果串慢速热解的影响
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