TESCAN LYRA3 FIB-SEM with integrated TOF-SIMS analyser

2017-11-07 18:00  下载量:21

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The unique combination of an FIB-SEM system from TESCAN and a Time-of-Flight (TOF) Secondary Ion Mass Spectrometer (SIMS) from TOFWERK represents a novel and cost-e?ective solution for material analysis. The user of the system is provided with information on the material composition (including light elements) and distribution of individual elements in the analysed volume. The integrated analyser can detect various trace elements, often at concentrations of a few ppm, and distinguish individual isotopes.

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